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Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes.

Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes.
Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes.
0-86341-695-0
29-32
Vaughan, A S
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Chen, G
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Lewin, P L
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Dodd, S J
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Swingler, S G
4f13fbb2-7d2e-480a-8687-acea6a4ed735
Vaughan, A S
6d813b66-17f9-4864-9763-25a6d659d8a3
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Dodd, S J
13f7eab0-eb74-4e89-83c6-555480aba185
Swingler, S G
4f13fbb2-7d2e-480a-8687-acea6a4ed735

Vaughan, A S, Chen, G, Lewin, P L, Dodd, S J and Swingler, S G (2006) Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes. IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, Savoy Place, London, United Kingdom. 25 - 26 Oct 2006. pp. 29-32 .

Record type: Conference or Workshop Item (Paper)
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More information

Published date: 2006
Additional Information: Event Dates: 25-26 October 2006
Venue - Dates: IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, Savoy Place, London, United Kingdom, 2006-10-25 - 2006-10-26
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 263228
URI: http://eprints.soton.ac.uk/id/eprint/263228
ISBN: 0-86341-695-0
PURE UUID: 5af9459f-4eed-4de4-831e-3f0ef011a1a2
ORCID for A S Vaughan: ORCID iD orcid.org/0000-0002-0535-513X
ORCID for P L Lewin: ORCID iD orcid.org/0000-0002-3299-2556

Catalogue record

Date deposited: 05 Dec 2006
Last modified: 15 Mar 2024 03:05

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Contributors

Author: A S Vaughan ORCID iD
Author: G Chen
Author: P L Lewin ORCID iD
Author: S J Dodd
Author: S G Swingler

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