Salem, M. A., Mizuta, Hiroshi, Oda, S., Fu, Y. and Willander, M. (2004) AFM current imaging for surface oxidized nanocrystalline silicon dots. 2004 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies, Niigata. p 241 .
Record type:
Conference or Workshop Item
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Published date: June 2004
Additional Information:
Event Dates: June 2004
Venue - Dates:
2004 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies, Niigata, 2004-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266339
URI: http://eprints.soton.ac.uk/id/eprint/266339
PURE UUID: 07c97457-6a0b-47c3-96b1-ad691884bac2
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Date deposited: 25 Jul 2008 08:37
Last modified: 14 Mar 2024 08:26
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Contributors
Author:
M. A. Salem
Author:
Hiroshi Mizuta
Author:
S. Oda
Author:
Y. Fu
Author:
M. Willander
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