Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2004) Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy. Microelectronic Engineering, 73-74, 615-619.
Record type:
Article
More information
Published date: 18 March 2004
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 267422
URI: http://eprints.soton.ac.uk/id/eprint/267422
ISSN: 0167-9317
PURE UUID: 5535d3a3-9614-4b4a-a6f3-76b6eaba86af
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Date deposited: 29 May 2009 16:11
Last modified: 14 Mar 2024 08:50
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Contributors
Author:
S Kanjanachuchai
Author:
Yoshishige Tsuchiya
Author:
K Usami
Author:
S Oda
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