Zeimpekis, Ioannis, Sun, Kai, Hu, Chunxiao, Thomas, Owain, de Planque, Maurits R.R., Chong, Harold M.H., Morgan, Hywel and Ashburn, Peter (2014) A differential measurement technique to eliminate parasitic resistance effects in ion sensitive sensors. Micro and Nano Engineering, Lausanne, Switzerland. 21 - 25 Sep 2014.
Record type:
Conference or Workshop Item
(Poster)
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Published date: 25 September 2014
Venue - Dates:
Micro and Nano Engineering, Lausanne, Switzerland, 2014-09-21 - 2014-09-25
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 371589
URI: http://eprints.soton.ac.uk/id/eprint/371589
PURE UUID: 55ec16a5-2679-44c2-ab29-5d51154c4fd1
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Date deposited: 09 Nov 2014 21:30
Last modified: 20 Jun 2022 01:40
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Contributors
Author:
Kai Sun
Author:
Chunxiao Hu
Author:
Owain Thomas
Author:
Maurits R.R. de Planque
Author:
Harold M.H. Chong
Author:
Hywel Morgan
Author:
Peter Ashburn
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