Chatzikyriakou, Eleni and De Groot, Cornelis (2016) Dataset: RDF and TID simulation of PDSOI 45nm MOSFET. University of Southampton doi:10.5258/SOTON/403024 [Dataset]
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Dataset
Abstract
Dataset supporting: Chatzikyriakou, Eleni, Redman-White, William and De Groot, Kees (2016) Total Ionizing Dose, Random Dopant Fluctuations and its combined effect in the 45 nm PDSOI node. Microelectronics Reliability.
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45nm_2D_Radiation.gzp
- Dataset
Available under License Creative Commons Attribution.
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45nm_35e17_Sano_NotNit.gzp
- Dataset
Available under License Creative Commons Attribution.
Download (415kB)
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45nm_IFM_NotNit.gzp
- Dataset
Available under License Creative Commons Attribution.
Download (421kB)
More information
Published date: 2016
Related URLs:
Organisations:
Electronics & Computer Science, Nanoelectronics and Nanotechnology
Projects:
Degradation mechanisms in semiconductor logic
Funded by: UNSPECIFIED (1304067)
1 October 2012 to 30 September 2015
Identifiers
Local EPrints ID: 403024
URI: http://eprints.soton.ac.uk/id/eprint/403024
PURE UUID: c576bfd0-e846-408a-9094-70b468c885de
Catalogue record
Date deposited: 23 Nov 2016 16:31
Last modified: 05 Nov 2023 02:38
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Contributors
Creator:
Eleni Chatzikyriakou
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