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High throughput synthesis and screening of chalcogenide materials for data storage

High throughput synthesis and screening of chalcogenide materials for data storage
High throughput synthesis and screening of chalcogenide materials for data storage
The ability to store information through the phase change mechanism is a well established technology for optical data storage, with typically germanium antimony telluride based films forming the active layer of a phase change disc. However, the ever increasing need for greater storage densities, shorter write/erase, duration and longer archival time is driving interest beyond these established materials. A new thin high throughput thin film deposition method provides a well controlled route to the synthesis of a wide range of chalcogenide compositions through simultaneous deposition of the component elements. When combined with fast primary and secondary screening techniques, the amorphous / crystalline phase transition can be characterised across the ternary compositional space. When combined with a full high throughput characterisation of the phases using EDX and XRD, conductivity measurements and ellipsometric characterisation of the optical properties, a better understanding of the desired phenomena for phase change memory applications is accessible. Results of a high throughput study of the GeSbTe system are presented.
1 pp
Guerin, S.
e185e0c2-85c6-4d1c-a2cf-cd2f410d346f
Hayden, B.
04522727-70ad-47c8-9644-8f335977b9b6
Hewak, D.W.
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Purdy, G.
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Simpson, R.
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Guerin, S.
e185e0c2-85c6-4d1c-a2cf-cd2f410d346f
Hayden, B.
04522727-70ad-47c8-9644-8f335977b9b6
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0
Purdy, G.
d05164e9-57c6-40e9-a270-603fcfcff0b8
Simpson, R.
b6a31f86-795a-4d0d-a519-96e0bfa7c377

Guerin, S., Hayden, B., Hewak, D.W., Purdy, G. and Simpson, R. (2005) High throughput synthesis and screening of chalcogenide materials for data storage. Singapore International Chemistry Conference 4, Singapore. 08 - 10 Dec 2005. 1 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

The ability to store information through the phase change mechanism is a well established technology for optical data storage, with typically germanium antimony telluride based films forming the active layer of a phase change disc. However, the ever increasing need for greater storage densities, shorter write/erase, duration and longer archival time is driving interest beyond these established materials. A new thin high throughput thin film deposition method provides a well controlled route to the synthesis of a wide range of chalcogenide compositions through simultaneous deposition of the component elements. When combined with fast primary and secondary screening techniques, the amorphous / crystalline phase transition can be characterised across the ternary compositional space. When combined with a full high throughput characterisation of the phases using EDX and XRD, conductivity measurements and ellipsometric characterisation of the optical properties, a better understanding of the desired phenomena for phase change memory applications is accessible. Results of a high throughput study of the GeSbTe system are presented.

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More information

Published date: 2005
Venue - Dates: Singapore International Chemistry Conference 4, Singapore, 2005-12-08 - 2005-12-10

Identifiers

Local EPrints ID: 42408
URI: http://eprints.soton.ac.uk/id/eprint/42408
PURE UUID: 1f5bb519-3946-433a-875f-3f2a259a787a
ORCID for D.W. Hewak: ORCID iD orcid.org/0000-0002-2093-5773

Catalogue record

Date deposited: 12 Dec 2006
Last modified: 15 Mar 2024 08:48

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Contributors

Author: S. Guerin
Author: B. Hayden
Author: D.W. Hewak ORCID iD
Author: G. Purdy
Author: R. Simpson

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