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The effect of visible and near infrared illumination on the mid infrared transmission of silicon and germanium

The effect of visible and near infrared illumination on the mid infrared transmission of silicon and germanium
The effect of visible and near infrared illumination on the mid infrared transmission of silicon and germanium
Germanium and silicon optical transmissive components are widely used in infrared lenses, filter substrates, etc. We demonstrate that severe loss can be induced in some germanium samples by illumination in the visible or near infrared with power densities in the region of watts per square centimeter. The absorption arises from light hole to heavy hole inter valence band transitions. The strength of the absorption induced depends on a number of parameters not normally controlled in optical applications, such as minority carrier lifetime and surface recombination velocity. The effect is very much weaker in silicon.
100-107
Rutt, Harvey N.
e09fa327-0c01-467a-9898-4e7f0cd715fc
Rutt, Harvey N.
e09fa327-0c01-467a-9898-4e7f0cd715fc

Rutt, Harvey N. (1994) The effect of visible and near infrared illumination on the mid infrared transmission of silicon and germanium. SPIE International Symposium on Optics Imaging and Instrumentation, San Diego, United States. 24 - 29 Jul 1994. pp. 100-107 . (doi:10.1117/12.187332).

Record type: Conference or Workshop Item (Paper)

Abstract

Germanium and silicon optical transmissive components are widely used in infrared lenses, filter substrates, etc. We demonstrate that severe loss can be induced in some germanium samples by illumination in the visible or near infrared with power densities in the region of watts per square centimeter. The absorption arises from light hole to heavy hole inter valence band transitions. The strength of the absorption induced depends on a number of parameters not normally controlled in optical applications, such as minority carrier lifetime and surface recombination velocity. The effect is very much weaker in silicon.

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More information

Published date: 1994
Additional Information: ISSN: 0277-786X
Venue - Dates: SPIE International Symposium on Optics Imaging and Instrumentation, San Diego, United States, 1994-07-24 - 1994-07-29

Identifiers

Local EPrints ID: 77086
URI: http://eprints.soton.ac.uk/id/eprint/77086
PURE UUID: ae7a3f01-b8a1-4da6-b708-966b91aec727

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Date deposited: 11 Mar 2010
Last modified: 13 Mar 2024 23:43

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Author: Harvey N. Rutt

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