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Harland, C.J., Klein, J.H., Akhter, P. and Venables, J.A. (1978) Electron back-scattering patterns in a field emission gun scanning electron microscope. In, Sturgess, J.M. (ed.) Proceedings of the 9th International Congress on Electron Microscopy. 9th International Congress on Electron Microscopy Toronto, Canada, Microscopical Society of Canada, 564-565. (Submitted).