Light-induced metallization at the gallium-silica interface
Light-induced metallization at the gallium-silica interface
Simultaneous measurements of the intensity and phase of a probe wave reflected from an interface between silica and elemental α-gallium reveal its very strong optical nonlinearity, affecting both these parameters of the reflected wave. The data corroborate with a nonthermal mechanism of optical response which assumes appearance of a homogeneous highly metallic layer, only a few nanometer thick, between the silica and bulk α-gallium.
193312-[4pp]
Petropoulos, P.
522b02cc-9f3f-468e-bca5-e9f58cc9cad7
Kim, H.S.
e5312734-e17b-419a-b18a-c5bff0c839c7
Richardson, D.J.
ebfe1ff9-d0c2-4e52-b7ae-c1b13bccdef3
Fedotov, V.A.
3725f5cc-2d0b-4e61-95c5-26d187c84f25
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
2001
Petropoulos, P.
522b02cc-9f3f-468e-bca5-e9f58cc9cad7
Kim, H.S.
e5312734-e17b-419a-b18a-c5bff0c839c7
Richardson, D.J.
ebfe1ff9-d0c2-4e52-b7ae-c1b13bccdef3
Fedotov, V.A.
3725f5cc-2d0b-4e61-95c5-26d187c84f25
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
Petropoulos, P., Kim, H.S., Richardson, D.J., Fedotov, V.A. and Zheludev, N.I.
(2001)
Light-induced metallization at the gallium-silica interface.
Physical Review B, 64 (19), .
(doi:10.1103/PhysRevB.64.193312).
Abstract
Simultaneous measurements of the intensity and phase of a probe wave reflected from an interface between silica and elemental α-gallium reveal its very strong optical nonlinearity, affecting both these parameters of the reflected wave. The data corroborate with a nonthermal mechanism of optical response which assumes appearance of a homogeneous highly metallic layer, only a few nanometer thick, between the silica and bulk α-gallium.
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Published date: 2001
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Local EPrints ID: 13666
URI: http://eprints.soton.ac.uk/id/eprint/13666
ISSN: 1550-235X
PURE UUID: 0f2d6e2f-9815-4851-8018-a080cc1a75c9
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Date deposited: 07 Jan 2005
Last modified: 16 Mar 2024 02:58
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Contributors
Author:
P. Petropoulos
Author:
H.S. Kim
Author:
V.A. Fedotov
Author:
N.I. Zheludev
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