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Practical technique for measurement of second-order nonlinearity in poled glass

Practical technique for measurement of second-order nonlinearity in poled glass
Practical technique for measurement of second-order nonlinearity in poled glass
A simple and nondestructive technique for measuring the thickness of the nonlinear optical layer in thermally poled glass, providing a minimum measurable thickness of 4 and 1µm resolution, is demonstrated. This technique is generally applicable to other nonlinear optical layers as well.
0013-5194
197-198
Corbari, C.
0d97e1c1-7a62-47c6-8f97-735f7946f93f
Deparis, O.
6bb2a112-4df2-4902-9645-dd3af9a8cedd
Klappauf, B.G.
3c294729-d837-4845-b946-276cf81db97c
Kazansky, P.G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c
Corbari, C.
0d97e1c1-7a62-47c6-8f97-735f7946f93f
Deparis, O.
6bb2a112-4df2-4902-9645-dd3af9a8cedd
Klappauf, B.G.
3c294729-d837-4845-b946-276cf81db97c
Kazansky, P.G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c

Corbari, C., Deparis, O., Klappauf, B.G. and Kazansky, P.G. (2003) Practical technique for measurement of second-order nonlinearity in poled glass. Electronics Letters, 39 (2), 197-198. (doi:10.1049/el:20030137).

Record type: Article

Abstract

A simple and nondestructive technique for measuring the thickness of the nonlinear optical layer in thermally poled glass, providing a minimum measurable thickness of 4 and 1µm resolution, is demonstrated. This technique is generally applicable to other nonlinear optical layers as well.

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Published date: 2003

Identifiers

Local EPrints ID: 13865
URI: http://eprints.soton.ac.uk/id/eprint/13865
ISSN: 0013-5194
PURE UUID: b8500d17-b1f4-4109-ab58-b5347bf8ab44

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Date deposited: 03 Jan 2005
Last modified: 11 Oct 2021 16:31

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Contributors

Author: C. Corbari
Author: O. Deparis
Author: B.G. Klappauf
Author: P.G. Kazansky

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