Resolution considerations in electro-optic single interface deflectors
Resolution considerations in electro-optic single interface deflectors
We discuss the maximum theoretical resolution of a single interface, electro-optically controllable beam deflector in domain-engineered LiNbO3 and report on experimental results for implementation of devices optimized either for maximum resolution or for maximum deflection angle. For the resolution optimized device we observed ~50 resolvable spots for a ±1250-V range, which to our knowledge is a report of one of the highest ratios of resolution per volt from a solid-state electro-optic beam deflector.
1038-1043
Barrington, S.J.
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Boyland, A.J.
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Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
2004
Barrington, S.J.
bf10bec5-2c40-4470-a0ef-5bcc69282d1a
Boyland, A.J.
7f024ca8-d41f-4aa2-9536-9baa0b8c892e
Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
Barrington, S.J., Boyland, A.J. and Eason, R.W.
(2004)
Resolution considerations in electro-optic single interface deflectors.
Applied Optics, 43 (5), .
(doi:10.1364/AO.43.001038).
Abstract
We discuss the maximum theoretical resolution of a single interface, electro-optically controllable beam deflector in domain-engineered LiNbO3 and report on experimental results for implementation of devices optimized either for maximum resolution or for maximum deflection angle. For the resolution optimized device we observed ~50 resolvable spots for a ±1250-V range, which to our knowledge is a report of one of the highest ratios of resolution per volt from a solid-state electro-optic beam deflector.
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Published date: 2004
Identifiers
Local EPrints ID: 13956
URI: http://eprints.soton.ac.uk/id/eprint/13956
ISSN: 0003-6935
PURE UUID: 6fc08ca1-dcbe-44c5-bbee-701d0e70b655
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Date deposited: 01 Jan 2005
Last modified: 16 Mar 2024 02:37
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Author:
S.J. Barrington
Author:
A.J. Boyland
Author:
R.W. Eason
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