Interfacial effects on the electrical properties of multiferroic BiFeO/Pt/Si thin film heterostructures
Interfacial effects on the electrical properties of multiferroic BiFeO/Pt/Si thin film heterostructures
Polycrystalline BiFeO3 thin films of various thickness were fabricated on (111)Pt/Ti/SiO2/Si substrates via chemical solution deposition. The electrical properties were investigated using impedance and leakage current measurements. X-ray photoelectron spectroscopy (XPS) combined with Ar ion milling (depth profiling) was used to investigate elemental distribution near the electrode–film interface. It is shown that the dielectric constant depends on film thickness due to the presence of an interfacial film–electrode layer evidenced by XPS investigation. Direct current conductivity is found to be governed by Schottky and/or Poole-Frenkel mechanisms
24-29
Yakovlev, S.
115fb426-5f61-4383-8336-f83207f33b64
Zekonyte, J.
4a1b52a8-fa37-45d8-88d8-593df2efe662
Solterbeck, C. H.
a70f7591-9e55-4cd1-9a8c-acbad3bdfb0e
Es Souni, M.
60140fcf-c227-40a7-8182-1bbcb579b69a
December 2005
Yakovlev, S.
115fb426-5f61-4383-8336-f83207f33b64
Zekonyte, J.
4a1b52a8-fa37-45d8-88d8-593df2efe662
Solterbeck, C. H.
a70f7591-9e55-4cd1-9a8c-acbad3bdfb0e
Es Souni, M.
60140fcf-c227-40a7-8182-1bbcb579b69a
Yakovlev, S., Zekonyte, J., Solterbeck, C. H. and Es Souni, M.
(2005)
Interfacial effects on the electrical properties of multiferroic BiFeO/Pt/Si thin film heterostructures.
Thin Solid Films, 493 (1-2), .
(doi:10.1016/j.tsf.2005.06.020).
Abstract
Polycrystalline BiFeO3 thin films of various thickness were fabricated on (111)Pt/Ti/SiO2/Si substrates via chemical solution deposition. The electrical properties were investigated using impedance and leakage current measurements. X-ray photoelectron spectroscopy (XPS) combined with Ar ion milling (depth profiling) was used to investigate elemental distribution near the electrode–film interface. It is shown that the dielectric constant depends on film thickness due to the presence of an interfacial film–electrode layer evidenced by XPS investigation. Direct current conductivity is found to be governed by Schottky and/or Poole-Frenkel mechanisms
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Published date: December 2005
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Local EPrints ID: 158481
URI: http://eprints.soton.ac.uk/id/eprint/158481
ISSN: 0040-6090
PURE UUID: 14b869e3-0e2e-4883-a571-7469bed7c4f1
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Date deposited: 02 Jul 2010 10:42
Last modified: 14 Mar 2024 01:50
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Author:
S. Yakovlev
Author:
J. Zekonyte
Author:
C. H. Solterbeck
Author:
M. Es Souni
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