The University of Southampton
University of Southampton Institutional Repository

Investigation of the interaction of evaporated aluminum with vapor deposited Teflon AF films via X-ray photoelectron spectroscopy

Investigation of the interaction of evaporated aluminum with vapor deposited Teflon AF films via X-ray photoelectron spectroscopy
Investigation of the interaction of evaporated aluminum with vapor deposited Teflon AF films via X-ray photoelectron spectroscopy
The interfacial bonding and mixing between evaporated aluminum and a vapor deposited Teflon AF (abbreviated to AF) film have been investigated with X-ray photoelectron spectroscopy. Graphite carbon (C–C), and aluminum carbide (Al–C), oxide (Al–O–C) and fluoride (Al–F) are formed when aluminum atoms are deposited on to the AF film. With increasing deposition of aluminum, the concentrations of these newly formed components increase gradually. Moreover, in situ annealing results in remarkable increases in the C–C, Al–C, Al–O–C and Al–F configurations and a decrease in metallic aluminum. No significant diffusion of aluminum into the AF film was observed during the annealing. The Al compounds form a layer at the Al/AF interface that acts as an adhesion promoter and diffusion barrier.
0947-8396
851-856
Ding, S.-J.
3d56b424-5b64-4378-8ac3-92e417086173
Zaporojtchenko, V.
0b31e301-6b39-467b-8702-bff5592065fd
Kruse, J.
0afe72d1-7cf7-4ee0-9da5-83e4097e2c24
Zekonyte, J.
4a1b52a8-fa37-45d8-88d8-593df2efe662
Faupel, F.
67261d48-5e0c-40e5-9957-dad59695b04b
Ding, S.-J.
3d56b424-5b64-4378-8ac3-92e417086173
Zaporojtchenko, V.
0b31e301-6b39-467b-8702-bff5592065fd
Kruse, J.
0afe72d1-7cf7-4ee0-9da5-83e4097e2c24
Zekonyte, J.
4a1b52a8-fa37-45d8-88d8-593df2efe662
Faupel, F.
67261d48-5e0c-40e5-9957-dad59695b04b

Ding, S.-J., Zaporojtchenko, V., Kruse, J., Zekonyte, J. and Faupel, F. (2003) Investigation of the interaction of evaporated aluminum with vapor deposited Teflon AF films via X-ray photoelectron spectroscopy. Applied Physics A: Materials Science & Processing, 76 (5), 851-856. (doi:10.1007/s00339-002-2031-2).

Record type: Article

Abstract

The interfacial bonding and mixing between evaporated aluminum and a vapor deposited Teflon AF (abbreviated to AF) film have been investigated with X-ray photoelectron spectroscopy. Graphite carbon (C–C), and aluminum carbide (Al–C), oxide (Al–O–C) and fluoride (Al–F) are formed when aluminum atoms are deposited on to the AF film. With increasing deposition of aluminum, the concentrations of these newly formed components increase gradually. Moreover, in situ annealing results in remarkable increases in the C–C, Al–C, Al–O–C and Al–F configurations and a decrease in metallic aluminum. No significant diffusion of aluminum into the AF film was observed during the annealing. The Al compounds form a layer at the Al/AF interface that acts as an adhesion promoter and diffusion barrier.

Full text not available from this repository.

More information

Published date: 2003

Identifiers

Local EPrints ID: 158513
URI: https://eprints.soton.ac.uk/id/eprint/158513
ISSN: 0947-8396
PURE UUID: bca8f427-372c-490a-a7c7-1d4c3d930750

Catalogue record

Date deposited: 22 Jun 2010 09:27
Last modified: 16 Jul 2019 23:55

Export record

Altmetrics

Contributors

Author: S.-J. Ding
Author: V. Zaporojtchenko
Author: J. Kruse
Author: J. Zekonyte
Author: F. Faupel

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of https://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×