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Bragg gratings in optical waveguides, glasses and thin oxide films induced by excimer laser radiation

Bragg gratings in optical waveguides, glasses and thin oxide films induced by excimer laser radiation
Bragg gratings in optical waveguides, glasses and thin oxide films induced by excimer laser radiation
The purpose of this thesis is the fabrication and characterisation of sub-micron period (~500nm) Bragg relief grating reflectors in optical waveguide structures using interferometric excimer laser ablation. Furthermore, the work presented in this thesis describes investigation of the feasibility of the application of excimer laser grating micromachining for the fabrication of waveguide gratings which may be used as wavelength filters in the 1.5µm band for optical communications applications. For this purpose the following studies were carried out: (i) the ablation of sub-micron relief gratings on Tl+ ion-exchanged channel waveguides in Er/Yb-codoped B1664 glass, using 193nm excimer laser radiation and (ii) the ablation of sub-micron relief gratings in InOx and Ta2O5 thin oxide films overlaid on K+ ion-exchanged channel waveguides in BK-7 glass, using 248nm excimer laser radiation. For the waveguide gratings in Tl+ ion-exchanged Er/Yb-codoped B1664 glass reflectivities greater than 28dB were obtained from a 6mm long grating. Similarly, reflectivities greater than 4.7dB and 18dB were produced by 16mm long gratings in K+ ion-exchanged channel waveguides in BK-7 glass overlaid with InOx and Ta2O5 thin oxide films, respectively. In parallel, the ablation behavior of borosilicate glass using 193nm radiation and that of InOx and Ta2O5 thin oxide films using 248nm radiation were studied experimentally. Waveguide grating theory based on the study of the dispersion properties of multi-layer step-index planar and graded-index channel waveguides and on the scattering behaviour of grating structures in waveguides, has been developed and analysed. This theoretical background is employed to design the waveguide gratings used and to explain the experimental results obtained. Finally, the photorefractive properties of InOx and Ta2O5 thin oxide films under UV radiation are experimentally investigated.
Pissadakis, S.
a91c54e0-3b8d-479f-b44e-e678bc34a277
Pissadakis, S.
a91c54e0-3b8d-479f-b44e-e678bc34a277

(2000) Bragg gratings in optical waveguides, glasses and thin oxide films induced by excimer laser radiation. University of Southampton, Department of Electronics and Computer Science, Doctoral Thesis.

Record type: Thesis (Doctoral)

Abstract

The purpose of this thesis is the fabrication and characterisation of sub-micron period (~500nm) Bragg relief grating reflectors in optical waveguide structures using interferometric excimer laser ablation. Furthermore, the work presented in this thesis describes investigation of the feasibility of the application of excimer laser grating micromachining for the fabrication of waveguide gratings which may be used as wavelength filters in the 1.5µm band for optical communications applications. For this purpose the following studies were carried out: (i) the ablation of sub-micron relief gratings on Tl+ ion-exchanged channel waveguides in Er/Yb-codoped B1664 glass, using 193nm excimer laser radiation and (ii) the ablation of sub-micron relief gratings in InOx and Ta2O5 thin oxide films overlaid on K+ ion-exchanged channel waveguides in BK-7 glass, using 248nm excimer laser radiation. For the waveguide gratings in Tl+ ion-exchanged Er/Yb-codoped B1664 glass reflectivities greater than 28dB were obtained from a 6mm long grating. Similarly, reflectivities greater than 4.7dB and 18dB were produced by 16mm long gratings in K+ ion-exchanged channel waveguides in BK-7 glass overlaid with InOx and Ta2O5 thin oxide films, respectively. In parallel, the ablation behavior of borosilicate glass using 193nm radiation and that of InOx and Ta2O5 thin oxide films using 248nm radiation were studied experimentally. Waveguide grating theory based on the study of the dispersion properties of multi-layer step-index planar and graded-index channel waveguides and on the scattering behaviour of grating structures in waveguides, has been developed and analysed. This theoretical background is employed to design the waveguide gratings used and to explain the experimental results obtained. Finally, the photorefractive properties of InOx and Ta2O5 thin oxide films under UV radiation are experimentally investigated.

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More information

Published date: 2000
Organisations: University of Southampton, Optoelectronics Research Centre, Electronics & Computer Science

Identifiers

Local EPrints ID: 15896
URI: http://eprints.soton.ac.uk/id/eprint/15896
PURE UUID: 8c449086-45d0-44bc-863d-69902de39313

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Date deposited: 09 Jun 2005
Last modified: 17 Jul 2017 16:44

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