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Assessment of waveguide thermal response by interrogation of UV written planar gratings

Assessment of waveguide thermal response by interrogation of UV written planar gratings
Assessment of waveguide thermal response by interrogation of UV written planar gratings
The technique of direct grating writing, based on direct ultraviolet writing, is demonstrated as a tool for highly accurate measurement of waveguide and material properties. Silica-on-silicon planar samples are processed using hydrogen loading and thermal locking before Bragg channel waveguides are defined in the photosensitive core layer. The refractive index is accurately probed to compare different thermal locking procedures and characterize waveguide thermal stability.
1041-1135
438-440
Sparrow, I.J.G.
3b11b080-98d5-41fe-8e15-bc12d17dc259
Emmerson, G.D.
89517051-daed-4f8e-aca6-f686d8c54e7c
Gawith, C.B.E.
926665c0-84c7-4a1d-ae19-ee6d7d14c43e
Watts, S.P.
aee81832-68b5-4260-8e93-90503cfce3af
Williams, R.B.
1d172577-abdb-4589-8ded-153cf6732c20
Smith, P.G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6
Sparrow, I.J.G.
3b11b080-98d5-41fe-8e15-bc12d17dc259
Emmerson, G.D.
89517051-daed-4f8e-aca6-f686d8c54e7c
Gawith, C.B.E.
926665c0-84c7-4a1d-ae19-ee6d7d14c43e
Watts, S.P.
aee81832-68b5-4260-8e93-90503cfce3af
Williams, R.B.
1d172577-abdb-4589-8ded-153cf6732c20
Smith, P.G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6

Sparrow, I.J.G., Emmerson, G.D., Gawith, C.B.E., Watts, S.P., Williams, R.B. and Smith, P.G.R. (2005) Assessment of waveguide thermal response by interrogation of UV written planar gratings. IEEE Photonics Technology Letters, 17 (2), 438-440. (doi:10.1109/LPT.2004.839457).

Record type: Article

Abstract

The technique of direct grating writing, based on direct ultraviolet writing, is demonstrated as a tool for highly accurate measurement of waveguide and material properties. Silica-on-silicon planar samples are processed using hydrogen loading and thermal locking before Bragg channel waveguides are defined in the photosensitive core layer. The refractive index is accurately probed to compare different thermal locking procedures and characterize waveguide thermal stability.

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Published date: 2005

Identifiers

Local EPrints ID: 16097
URI: https://eprints.soton.ac.uk/id/eprint/16097
ISSN: 1041-1135
PURE UUID: 565723dc-5808-43ef-bea9-82526b926d9d
ORCID for C.B.E. Gawith: ORCID iD orcid.org/0000-0002-3502-3558

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Date deposited: 23 Jun 2005
Last modified: 20 Jul 2019 01:08

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Contributors

Author: I.J.G. Sparrow
Author: G.D. Emmerson
Author: C.B.E. Gawith ORCID iD
Author: S.P. Watts
Author: R.B. Williams
Author: P.G.R. Smith

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