Wyeth, P., Macdonald, A.M. and Vaughan, A.S. (2003) How scattering can compromise Raman depth profiling data. Raman Spectroscopy of Materials, Institute of Physics, London, UK. 15 Jan 2003.
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Conference or Workshop Item
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Published date: 2003
Venue - Dates:
Raman Spectroscopy of Materials, Institute of Physics, London, UK, 2003-01-15 - 2003-01-15
Keywords:
scattering, compromise, Raman spectroscopy, depth profiling data
Identifiers
Local EPrints ID: 16474
URI: http://eprints.soton.ac.uk/id/eprint/16474
PURE UUID: 18ca3d52-4d3b-48fb-b704-957d89a79497
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Date deposited: 08 Aug 2005
Last modified: 11 Dec 2021 14:06
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Contributors
Author:
P. Wyeth
Author:
A.M. Macdonald
Author:
A.S. Vaughan
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