Brown, I., Mues, C. and Thomas, L.C. (2010) Regression model development for exposure at default (EAD). 24th European Conference on Operational Research (EURO XXIV), , Lisbon, Portugal. 10 - 13 Jul 2010.
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Published date: July 2010
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24th European Conference on Operational Research (EURO XXIV), , Lisbon, Portugal, 2010-07-10 - 2010-07-13
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Local EPrints ID: 165621
URI: http://eprints.soton.ac.uk/id/eprint/165621
PURE UUID: 6a22cc77-da66-4b54-b4a3-d78f3e5b89a9
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Date deposited: 19 Oct 2010 09:01
Last modified: 08 Apr 2022 01:38
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Author:
I. Brown
Author:
L.C. Thomas
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