Regression model development for exposure at default (EAD)


Brown, I., Mues, C. and Thomas, L.C. (2010) Regression model development for exposure at default (EAD) At 24th European Conference on Operational Research, Portugal. 10 - 13 Jul 2010.

Download

Full text not available from this repository.

Item Type: Conference or Workshop Item (Paper)
Venue - Dates: 24th European Conference on Operational Research, Portugal, 2010-07-10 - 2010-07-13
Related URLs:
Subjects:
ePrint ID: 165621
Date :
Date Event
July 2010Published
Date Deposited: 19 Oct 2010 09:01
Last Modified: 18 Apr 2017 03:40
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/165621

Actions (login required)

View Item View Item