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Regression model development for exposure at default (EAD)

Brown, I., Mues, C. and Thomas, L.C. (2010) Regression model development for exposure at default (EAD) At 24th European Conference on Operational Research, Portugal. 10 - 13 Jul 2010.

Record type: Conference or Workshop Item (Paper)

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Published date: July 2010
Venue - Dates: 24th European Conference on Operational Research, Portugal, 2010-07-10 - 2010-07-13

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Local EPrints ID: 165621
URI: http://eprints.soton.ac.uk/id/eprint/165621
PURE UUID: 6a22cc77-da66-4b54-b4a3-d78f3e5b89a9

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Date deposited: 19 Oct 2010 09:01
Last modified: 18 Jul 2017 12:27

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Contributors

Author: I. Brown
Author: C. Mues
Author: L.C. Thomas

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