Evaluation of the X-ray CT visualisation techique for characterising electrical contacts
Evaluation of the X-ray CT visualisation techique for characterising electrical contacts
The visualisation of two contacting surfaces has typically involved profiling each surface when separated. These profiling techniques have included scanning probe microscopy to a resolution down to the nanometre scale and optical non-contact profiling techniques at the sub-micrometre scale. Moreover, a number of techniques are being developed to profile the contacting surfaces in situ, i.e. without the need to separate the surfaces. An X-Ray Computer Tomography (CT) technique is under development at Southampton to visualise electrical contacts without dismantling the component parts. Contact maps of high force bolted interfaces, which successfully show contacting surfaces to a resolution of 6.4 ?m have been presented before. This paper overviews the validation of this technique, evaluates the main advantages and disadvantages compared to other techniques, and shows how this can be used to better understand the electrical contact interface
978-1-4244-8174-3
1-6
Lalechos, A.
e0137633-f8bf-4f49-abe4-49b64e4082c3
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Swingler, J.
c6e2a49e-fadd-4f38-99f7-0ee1e2c92fac
1 October 2010
Lalechos, A.
e0137633-f8bf-4f49-abe4-49b64e4082c3
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Swingler, J.
c6e2a49e-fadd-4f38-99f7-0ee1e2c92fac
Lalechos, A., McBride, J.W. and Swingler, J.
(2010)
Evaluation of the X-ray CT visualisation techique for characterising electrical contacts.
In Proceedings of the The 56th IEE Holm Conference on Electrical Contacts.
IEEE.
.
(doi:10.1109/HOLM.2010.5619545).
Record type:
Conference or Workshop Item
(Paper)
Abstract
The visualisation of two contacting surfaces has typically involved profiling each surface when separated. These profiling techniques have included scanning probe microscopy to a resolution down to the nanometre scale and optical non-contact profiling techniques at the sub-micrometre scale. Moreover, a number of techniques are being developed to profile the contacting surfaces in situ, i.e. without the need to separate the surfaces. An X-Ray Computer Tomography (CT) technique is under development at Southampton to visualise electrical contacts without dismantling the component parts. Contact maps of high force bolted interfaces, which successfully show contacting surfaces to a resolution of 6.4 ?m have been presented before. This paper overviews the validation of this technique, evaluates the main advantages and disadvantages compared to other techniques, and shows how this can be used to better understand the electrical contact interface
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Published date: 1 October 2010
Venue - Dates:
56th IEE Holm Conference on Electrical Contacts, Charleston, United States, 2010-10-01
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Local EPrints ID: 174769
URI: http://eprints.soton.ac.uk/id/eprint/174769
ISBN: 978-1-4244-8174-3
PURE UUID: 9a55580f-3add-4411-93a3-c31245e1471e
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Date deposited: 17 Feb 2011 12:22
Last modified: 15 Mar 2024 02:39
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Author:
A. Lalechos
Author:
J. Swingler
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