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High throughput synthesis and characterization of the PbnNb2O5+n (0.5 < n < 4.1) system on a single chip

High throughput synthesis and characterization of the PbnNb2O5+n (0.5 < n < 4.1) system on a single chip
High throughput synthesis and characterization of the PbnNb2O5+n (0.5 < n < 4.1) system on a single chip
Most high throughput studies focus on assessing the effect of composition within a single known fundamental structure type, such as perovskite. Here we demonstrate how high throughput synthesis and screening can be used to establish structure–property relations in the PbO–Nb2O5 system, for which eight distinct fundamental structure types are known to exist. PbNb4O11, PbNb2O6 and pyrochlore could be easily distinguished by X-ray diffraction (XRD). However, XRD was insensitive to distortions of the pyrochlore structure and instead Raman spectroscopy was utilized to determine changes in symmetry from cubic to rhombohedral as the PbO concentration increased. High throughput screening of the capacitance revealed permittivity (εr) maxima in the PbNb4O11r = 700) and cubic pyrochlore phases (εr = 450). The εr of PbNb4O11 has not to date been reported but the value for cubic pyrochlore is higher than that reported for bulk ceramics (εr = 270). Initial high electric field studies also revealed exceptionally high tunability (four times that reported for bismuth zinc niobate-based pyrochlores) of the capacitance in the pyrochlore phase.
thin films, structure–property relationship, electrical properties, microstructure, physical vapor deposition
1359-6454
2201-2209
Mirsaneh, Mehdi
7deb15ab-a6d4-4647-bbfc-60a0c985b752
Hayden, Brian E.
aea74f68-2264-4487-9d84-5b12ddbbb331
Miao, Shu
ccd103ed-c2fd-4b52-b285-0ae02bce938a
Pokorny, Jan
013a8aba-a213-4299-9b2d-05e615ce6c5a
Perini, Steve
d62eef85-9e7e-4d7b-a83f-f542feff225c
Furman, Eugene
e0bd310d-2a98-4689-9021-e9b341444ecb
Lanagan, Michael T.
5b3f8f42-331b-4b7c-aaea-6ebde5009649
Ubic, Rick
c7b04bfa-5570-4edb-8aab-03988aac10cf
Reaney, Ian M.
0b432c38-9406-4216-aff4-a42bba70527b
Mirsaneh, Mehdi
7deb15ab-a6d4-4647-bbfc-60a0c985b752
Hayden, Brian E.
aea74f68-2264-4487-9d84-5b12ddbbb331
Miao, Shu
ccd103ed-c2fd-4b52-b285-0ae02bce938a
Pokorny, Jan
013a8aba-a213-4299-9b2d-05e615ce6c5a
Perini, Steve
d62eef85-9e7e-4d7b-a83f-f542feff225c
Furman, Eugene
e0bd310d-2a98-4689-9021-e9b341444ecb
Lanagan, Michael T.
5b3f8f42-331b-4b7c-aaea-6ebde5009649
Ubic, Rick
c7b04bfa-5570-4edb-8aab-03988aac10cf
Reaney, Ian M.
0b432c38-9406-4216-aff4-a42bba70527b

Mirsaneh, Mehdi, Hayden, Brian E., Miao, Shu, Pokorny, Jan, Perini, Steve, Furman, Eugene, Lanagan, Michael T., Ubic, Rick and Reaney, Ian M. (2011) High throughput synthesis and characterization of the PbnNb2O5+n (0.5 < n < 4.1) system on a single chip. Acta Materialia, 59 (5), 2201-2209. (doi:10.1016/j.actamat.2010.12.023).

Record type: Article

Abstract

Most high throughput studies focus on assessing the effect of composition within a single known fundamental structure type, such as perovskite. Here we demonstrate how high throughput synthesis and screening can be used to establish structure–property relations in the PbO–Nb2O5 system, for which eight distinct fundamental structure types are known to exist. PbNb4O11, PbNb2O6 and pyrochlore could be easily distinguished by X-ray diffraction (XRD). However, XRD was insensitive to distortions of the pyrochlore structure and instead Raman spectroscopy was utilized to determine changes in symmetry from cubic to rhombohedral as the PbO concentration increased. High throughput screening of the capacitance revealed permittivity (εr) maxima in the PbNb4O11r = 700) and cubic pyrochlore phases (εr = 450). The εr of PbNb4O11 has not to date been reported but the value for cubic pyrochlore is higher than that reported for bulk ceramics (εr = 270). Initial high electric field studies also revealed exceptionally high tunability (four times that reported for bismuth zinc niobate-based pyrochlores) of the capacitance in the pyrochlore phase.

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More information

Published date: March 2011
Keywords: thin films, structure–property relationship, electrical properties, microstructure, physical vapor deposition

Identifiers

Local EPrints ID: 178435
URI: http://eprints.soton.ac.uk/id/eprint/178435
ISSN: 1359-6454
PURE UUID: 17d0cce3-a7c7-499e-9895-5863e7c37d52
ORCID for Brian E. Hayden: ORCID iD orcid.org/0000-0002-7762-1812

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Date deposited: 25 Mar 2011 15:08
Last modified: 15 Mar 2024 02:36

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Contributors

Author: Mehdi Mirsaneh
Author: Brian E. Hayden ORCID iD
Author: Shu Miao
Author: Jan Pokorny
Author: Steve Perini
Author: Eugene Furman
Author: Michael T. Lanagan
Author: Rick Ubic
Author: Ian M. Reaney

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