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Atomic force microscopy-scanning electrochemical microscopy: influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes

Atomic force microscopy-scanning electrochemical microscopy: influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes
Atomic force microscopy-scanning electrochemical microscopy: influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes
Numerical simulations were performed to predict the amperometric response of conical electrodes used as atomic force microscopy-scanning electrochemical microscopy (AFM-SECM) probes. A simple general expression was derived which predicts their steady state limiting current as a function of their insulation sheath thickness and cone aspect ratio. Simulated currents were successfully compared with experimental currents. Geometrical parameters such as insulation angle and tip bluntness were then studied to determine their effect on the limiting current. Typical tip defects were also modeled using 3D simulations, and their influence on the current was quantified. Although obtained for SECM-AFM probes, these results are directly applicable to conical micro- and nanoelectrodes.
0003-2700
2971-2977
Leonhardt, Kelly
2bf57566-d3c5-40b4-8137-684153f22974
Avdic, Amra
022fed2a-e835-4150-bb23-1ae462ce705d
Lugstein, Alois
702eddde-b4ab-48bb-b8a4-48854cb5bb99
Pobelov, Ilya
1727d807-9b11-4dc3-a168-90a1f3f867c6
Wandlowski, Thomas
23e26a9d-d828-4229-905d-712d41dbf0e9
Wu, Ming
c36af383-7ea7-449e-b432-6740de5b4a6e
Gollas, Bernhard
8b16f513-ff40-481d-ac6c-4a9240398ab7
Denuault, Guy
5c76e69f-e04e-4be5-83c5-e729887ffd4e
Leonhardt, Kelly
2bf57566-d3c5-40b4-8137-684153f22974
Avdic, Amra
022fed2a-e835-4150-bb23-1ae462ce705d
Lugstein, Alois
702eddde-b4ab-48bb-b8a4-48854cb5bb99
Pobelov, Ilya
1727d807-9b11-4dc3-a168-90a1f3f867c6
Wandlowski, Thomas
23e26a9d-d828-4229-905d-712d41dbf0e9
Wu, Ming
c36af383-7ea7-449e-b432-6740de5b4a6e
Gollas, Bernhard
8b16f513-ff40-481d-ac6c-4a9240398ab7
Denuault, Guy
5c76e69f-e04e-4be5-83c5-e729887ffd4e

Leonhardt, Kelly, Avdic, Amra, Lugstein, Alois, Pobelov, Ilya, Wandlowski, Thomas, Wu, Ming, Gollas, Bernhard and Denuault, Guy (2011) Atomic force microscopy-scanning electrochemical microscopy: influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes. Analytical Chemistry, 83 (8), 2971-2977. (doi:10.1021/ac103083y).

Record type: Article

Abstract

Numerical simulations were performed to predict the amperometric response of conical electrodes used as atomic force microscopy-scanning electrochemical microscopy (AFM-SECM) probes. A simple general expression was derived which predicts their steady state limiting current as a function of their insulation sheath thickness and cone aspect ratio. Simulated currents were successfully compared with experimental currents. Geometrical parameters such as insulation angle and tip bluntness were then studied to determine their effect on the limiting current. Typical tip defects were also modeled using 3D simulations, and their influence on the current was quantified. Although obtained for SECM-AFM probes, these results are directly applicable to conical micro- and nanoelectrodes.

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More information

Published date: 28 March 2011
Organisations: Chemistry

Identifiers

Local EPrints ID: 179131
URI: http://eprints.soton.ac.uk/id/eprint/179131
ISSN: 0003-2700
PURE UUID: 58083fb9-f92b-40c5-99a7-0c08d346eefd
ORCID for Guy Denuault: ORCID iD orcid.org/0000-0002-8630-9492

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Date deposited: 01 Apr 2011 10:43
Last modified: 15 Mar 2024 02:44

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Contributors

Author: Kelly Leonhardt
Author: Amra Avdic
Author: Alois Lugstein
Author: Ilya Pobelov
Author: Thomas Wandlowski
Author: Ming Wu
Author: Bernhard Gollas
Author: Guy Denuault ORCID iD

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