Applications of the boundary element method in electrochemistry: scanning electrochemical microscopy, part 2

Fulian, Q., Fisher, A.C. and Denuault, G. (1999) Applications of the boundary element method in electrochemistry: scanning electrochemical microscopy, part 2. The Journal of Physical Chemistry B, 103 (21), 4393-4398. (doi:10.1021/jp983993k).

Record type: Article

Abstract

Boundary element method (BEM) simulations are presented for a range of scanning electrochemical microscopy applications. Calculations are performed to quantify the effects of the surrounding shield for a range of tip geometries and produce three-dimensional images of electrodes embedded in substrate surfaces. Approach curves are presented for a range of experimentally exploited probes, including the sphere-cap electrode. In addition, the BEM is used to generate a line scan across the interface between a conducting and nonconducting substrate for different tip geometries. The comparative resolution at a fixed tip-substrate separation for a microdisk and microhemisphere probe is noted. Finally, three-dimensional images of raised and recessed hemispherical electrodes embedded in nonconducting flat substrates are generated and the results compared to the image of a microdisk electrode.

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