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Applications of the boundary element method in electrochemistry: scanning electrochemical microscopy

Applications of the boundary element method in electrochemistry: scanning electrochemical microscopy
Applications of the boundary element method in electrochemistry: scanning electrochemical microscopy
Boundary element method (BEM) simulations are presented for a range of scanning electrochemical microscopy applications. Calculations are performed to quantify the effects of the surrounding shield for a range of tip geometries and produce three-dimensional images of electrodes embedded in substrate surfaces. Approach curves are presented for a range of experimentally exploited probes, including the sphere?cap electrode. In addition, the BEM is used to generate a line scan across the interface between a conducting and nonconducting substrate for different tip geometries. The comparative resolution at a fixed tip?substrate separation for a microdisk and microhemisphere probe is noted. Finally, three-dimensional images of raised and recessed hemispherical electrodes embedded in nonconducting flat substrates are generated and the results compared to the image of a microdisk electrode.
1520-5207
4387-4392
Fulian, Q.
e8ca7337-06d9-4cb3-81a4-7fdc9afe527f
Fisher, A.C.
7a0c1794-554e-4b8e-8e7d-90c2e6001e3b
Denuault, G.
5c76e69f-e04e-4be5-83c5-e729887ffd4e
Fulian, Q.
e8ca7337-06d9-4cb3-81a4-7fdc9afe527f
Fisher, A.C.
7a0c1794-554e-4b8e-8e7d-90c2e6001e3b
Denuault, G.
5c76e69f-e04e-4be5-83c5-e729887ffd4e

Fulian, Q., Fisher, A.C. and Denuault, G. (1999) Applications of the boundary element method in electrochemistry: scanning electrochemical microscopy. The Journal of Physical Chemistry B, 103 (21), 4387-4392. (doi:10.1021/jp983732a).

Record type: Article

Abstract

Boundary element method (BEM) simulations are presented for a range of scanning electrochemical microscopy applications. Calculations are performed to quantify the effects of the surrounding shield for a range of tip geometries and produce three-dimensional images of electrodes embedded in substrate surfaces. Approach curves are presented for a range of experimentally exploited probes, including the sphere?cap electrode. In addition, the BEM is used to generate a line scan across the interface between a conducting and nonconducting substrate for different tip geometries. The comparative resolution at a fixed tip?substrate separation for a microdisk and microhemisphere probe is noted. Finally, three-dimensional images of raised and recessed hemispherical electrodes embedded in nonconducting flat substrates are generated and the results compared to the image of a microdisk electrode.

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Published date: 1999

Identifiers

Local EPrints ID: 179235
URI: http://eprints.soton.ac.uk/id/eprint/179235
ISSN: 1520-5207
PURE UUID: 662517a0-20d4-4ad1-905a-c276aff4b325
ORCID for G. Denuault: ORCID iD orcid.org/0000-0002-8630-9492

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Date deposited: 01 Apr 2011 08:50
Last modified: 07 Oct 2020 01:36

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