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Scanning electrochemical microscope (SECM) study of the relationship between proton concentration and electronic charge as a function of ionic strength during the oxidation of polyaniline

Record type: Article

The SECM has been used to investigate the influence of ionic strength on the ingress and egress of protons to and from a polyaniline (PANI) film. This was done in solutions containing 0.01 mol dm(-3) HCl, with concentrations of NaCl ranging from 0 to 0.5 mol dm(-3), by measuring the steady-state faradaic current for H+ reduction on a 18 mu m diameter Pt microdisc located within few micrometres of the PANI film while cycling the potential of the film through the different oxidation states. The microelectrode response was calibrated using microdiscs of various sizes in different solutions of HCl, with and without the presence of supporting electrolyte. This investigation shows the influence of ionic strength on the film mechanism and in particular on the relationship between the behaviour of H+ at the film\solution interface and the behaviour of electrons at the film\electrode interface.

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Citation

Frank, Maria Helena Troise and Denuault, Guy (1994) Scanning electrochemical microscope (SECM) study of the relationship between proton concentration and electronic charge as a function of ionic strength during the oxidation of polyaniline Journal of Electroanalytical Chemistry, 379, (1-2), pp. 399-406. (doi:10.1016/0022-0728(94)87163-9).

More information

Published date: 12 December 1994
Keywords: scanning electrochemical microscope, ionic strength, oxidation, polyaniline

Identifiers

Local EPrints ID: 179271
URI: http://eprints.soton.ac.uk/id/eprint/179271
ISSN: 1572-6657
PURE UUID: cf3ea955-b61b-4047-9613-5cd28a737fca
ORCID for Guy Denuault: ORCID iD orcid.org/0000-0002-8630-9492

Catalogue record

Date deposited: 31 Mar 2011 13:38
Last modified: 18 Jul 2017 12:03

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Contributors

Author: Maria Helena Troise Frank
Author: Guy Denuault ORCID iD

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