Scanning electrochemical microscopy: theory and application of the transient (chronoamperometric) SECM response
Scanning electrochemical microscopy: theory and application of the transient (chronoamperometric) SECM response
A study of the transient (chronoamperometric) response of the scanning electrochemical microscope (SECM) is presented. SECM transients were simulated digitally with a novel integrator based on a Krylov algorithm. The transients observed with planar electrodes (PE), microdisks (MD), and thin-layer cells (TLC) are shown to be limiting cases that fit the simulated SECM transients at very short, intermediate, and long times, respectively. A procedure is established that, provided the tip radius is known, allows the determination of the diffusion coefficient of the species in solution independent of its concentration and the number of electrons transferred in the electrode reaction. Experimental SECM transients are reported for the electrochemical oxidation of Fe(CN)64- in KCl; the diffusion coefficient of Fe(CN)6(4-) was found to agree very well with the literature value.
1282-1288
Bard, Allen J.
90fc8cae-46e8-4190-bc21-4031ad75cc33
Denuault, Guy
5c76e69f-e04e-4be5-83c5-e729887ffd4e
Friesner, Richard A.
c368f936-c389-49d6-8ab0-7c08b4662aab
Dornblaser, Bright C.
f7fa4b0a-1d4a-4995-af84-c2ed9444fcf4
Tuckerman, L.aurette S.
e0c19658-1085-40c9-a0cd-d12b0f065576
July 1991
Bard, Allen J.
90fc8cae-46e8-4190-bc21-4031ad75cc33
Denuault, Guy
5c76e69f-e04e-4be5-83c5-e729887ffd4e
Friesner, Richard A.
c368f936-c389-49d6-8ab0-7c08b4662aab
Dornblaser, Bright C.
f7fa4b0a-1d4a-4995-af84-c2ed9444fcf4
Tuckerman, L.aurette S.
e0c19658-1085-40c9-a0cd-d12b0f065576
Bard, Allen J., Denuault, Guy, Friesner, Richard A., Dornblaser, Bright C. and Tuckerman, L.aurette S.
(1991)
Scanning electrochemical microscopy: theory and application of the transient (chronoamperometric) SECM response.
Analytical Chemistry, 63 (13), .
(doi:10.1021/issn.0003-2700).
(PMID:1897720)
Abstract
A study of the transient (chronoamperometric) response of the scanning electrochemical microscope (SECM) is presented. SECM transients were simulated digitally with a novel integrator based on a Krylov algorithm. The transients observed with planar electrodes (PE), microdisks (MD), and thin-layer cells (TLC) are shown to be limiting cases that fit the simulated SECM transients at very short, intermediate, and long times, respectively. A procedure is established that, provided the tip radius is known, allows the determination of the diffusion coefficient of the species in solution independent of its concentration and the number of electrons transferred in the electrode reaction. Experimental SECM transients are reported for the electrochemical oxidation of Fe(CN)64- in KCl; the diffusion coefficient of Fe(CN)6(4-) was found to agree very well with the literature value.
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Published date: July 1991
Identifiers
Local EPrints ID: 179281
URI: http://eprints.soton.ac.uk/id/eprint/179281
ISSN: 0003-2700
PURE UUID: f9e4f176-ad78-4433-9b8e-0eb16a6ef5cf
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Date deposited: 07 Apr 2011 13:34
Last modified: 15 Mar 2024 02:44
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Contributors
Author:
Allen J. Bard
Author:
Richard A. Friesner
Author:
Bright C. Dornblaser
Author:
L.aurette S. Tuckerman
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