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Scanning electrochemical microscopy: theory and application of the transient (chronoamperometric) SECM response

Record type: Article

A study of the transient (chronoamperometric) response of the scanning electrochemical microscope (SECM) is presented. SECM transients were simulated digitally with a novel integrator based on a Krylov algorithm. The transients observed with planar electrodes (PE), microdisks (MD), and thin-layer cells (TLC) are shown to be limiting cases that fit the simulated SECM transients at very short, intermediate, and long times, respectively. A procedure is established that, provided the tip radius is known, allows the determination of the diffusion coefficient of the species in solution independent of its concentration and the number of electrons transferred in the electrode reaction. Experimental SECM transients are reported for the electrochemical oxidation of Fe(CN)64- in KCl; the diffusion coefficient of Fe(CN)6(4-) was found to agree very well with the literature value.

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Citation

Bard, Allen J., Denuault, Guy, Friesner, Richard A., Dornblaser, Bright C. and Tuckerman, L.aurette S. (1991) Scanning electrochemical microscopy: theory and application of the transient (chronoamperometric) SECM response Analytical Chemistry, 63, (13), pp. 1282-1288. (doi:10.1021/issn.0003-2700). (PMID:1897720).

More information

Published date: July 1991

Identifiers

Local EPrints ID: 179281
URI: http://eprints.soton.ac.uk/id/eprint/179281
ISSN: 0003-2700
PURE UUID: f9e4f176-ad78-4433-9b8e-0eb16a6ef5cf
ORCID for Guy Denuault: ORCID iD orcid.org/0000-0002-8630-9492

Catalogue record

Date deposited: 07 Apr 2011 13:34
Last modified: 18 Jul 2017 12:03

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Contributors

Author: Allen J. Bard
Author: Guy Denuault ORCID iD
Author: Richard A. Friesner
Author: Bright C. Dornblaser
Author: L.aurette S. Tuckerman

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