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The behavior of microdisk and microring electrodes: Prediction of the chronoamperometric response of microdisks and of the steady state for CE and EC catalytic reactions by application of Neumann's integral theorem

Record type: Article

It is shown that the chronoamperometric response at microdisk electrodes can be derived from Neumann's integral theorem of two parameters. The form of the transients can be predicted for a wide range of boundary conditions and this is illustrated by the relaxation behavior of irreversible reactions in addition to that of the widely investigated example of zero surface concentration of the reactant. Corrections to the transitions due to the tertiary current distribution are derived for relaxation experiments and it is shown that the methods developed can also be applied to linear sweep voltammetry.

The steady state behavior of CE and EC catalytic reactions is formally similar to the chronoamperometry of irreversible electrode reactions and it is shown that complete descriptions can be obtained for the voltammetry of such systems.

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Citation

Fleischmann, M., Pletcher, Derek, Denuault, Guy, Daschbach, John and Pons, Stanley (1989) The behavior of microdisk and microring electrodes: Prediction of the chronoamperometric response of microdisks and of the steady state for CE and EC catalytic reactions by application of Neumann's integral theorem Journal of Electroanalytical Chemistry, 263, (2), pp. 225-236.

More information

Published date: 25 May 1989
Additional Information: U8885

Identifiers

Local EPrints ID: 179289
URI: http://eprints.soton.ac.uk/id/eprint/179289
ISSN: 1572-6657
PURE UUID: 1cff08b2-13fb-4962-8ace-2fde5e96590b
ORCID for Guy Denuault: ORCID iD orcid.org/0000-0002-8630-9492

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Date deposited: 01 Apr 2011 08:20
Last modified: 18 Jul 2017 12:03

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Contributors

Author: M. Fleischmann
Author: Derek Pletcher
Author: Guy Denuault ORCID iD
Author: John Daschbach
Author: Stanley Pons

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