The University of Southampton
University of Southampton Institutional Repository
Warning ePrints Soton is experiencing an issue with some file downloads not being available. We are working hard to fix this. Please bear with us.

Normalizing XRF-scanner data: A cautionary note on the interpretation of high-resolution records from organic-rich lakes

Normalizing XRF-scanner data: A cautionary note on the interpretation of high-resolution records from organic-rich lakes
Normalizing XRF-scanner data: A cautionary note on the interpretation of high-resolution records from organic-rich lakes
X-ray fluorescence (XRF) scanning of unlithified, untreated sediment cores is becoming an increasingly common method used to obtain paleoproxy data from lake records. XRF-scanning is fast and delivers high-resolution records of relative variations in the elemental composition of the sediment. However, lake sediments display extreme variations in their organic matter content, which can vary from just a few percent to well over 50%. As XRF scanners are largely insensitive to organic material in the sediment, increasing levels of organic material effectively dilute those components that can be measured, such as the lithogenic material (the closed-sum effect). Consequently, in sediments with large variations in organic material, the measured variations in an element will to a large extent mirror the changes in organic material. It is therefore necessary to normalize the elements in the lithogenic component of the sediment against a conservative element to allow changes in the input of the elements to be addressed. In this study we show that Al, which is the lightest element that can be measured using the Itrax XRF-scanner, can be used to effectively normalize the elements of the lithogenic fraction of the sediment against variations in organic content. We also show that care must be taken when choosing resolution and exposure time to ensure optimal output from the measurements.
XRF-scanning, Normalization, Lake sediment
0743-9547
1250-1256
Löwemark, L.
bb747ed7-84d5-4dff-80b4-92583edf7b4f
Chen, H.-F.
ed82d626-84ea-4b9e-be83-4ccfe5bf68e7
Yang, T.-N.
0c51ac4c-6522-4a79-87de-a78d4b10d986
Kylander, M.
284172d5-2d8f-4c1b-89fa-f28a5cd6aa93
Yu, E.-F.
f5676614-8fb8-40c7-a33b-830059b98983
Hsu, Y.-W.
89d997c7-c97d-4f65-bd08-9d698a5c93ee
Lee, T.-Q.
e672fec6-8e9b-4bf1-8b7b-126f43d52222
Song, S.-R.
d34b0f6a-3842-4f97-9a26-9e69196e6d09
Jarvis, S.
caca9d70-b960-4301-82eb-cecf41832a16
Löwemark, L.
bb747ed7-84d5-4dff-80b4-92583edf7b4f
Chen, H.-F.
ed82d626-84ea-4b9e-be83-4ccfe5bf68e7
Yang, T.-N.
0c51ac4c-6522-4a79-87de-a78d4b10d986
Kylander, M.
284172d5-2d8f-4c1b-89fa-f28a5cd6aa93
Yu, E.-F.
f5676614-8fb8-40c7-a33b-830059b98983
Hsu, Y.-W.
89d997c7-c97d-4f65-bd08-9d698a5c93ee
Lee, T.-Q.
e672fec6-8e9b-4bf1-8b7b-126f43d52222
Song, S.-R.
d34b0f6a-3842-4f97-9a26-9e69196e6d09
Jarvis, S.
caca9d70-b960-4301-82eb-cecf41832a16

Löwemark, L., Chen, H.-F., Yang, T.-N., Kylander, M., Yu, E.-F., Hsu, Y.-W., Lee, T.-Q., Song, S.-R. and Jarvis, S. (2011) Normalizing XRF-scanner data: A cautionary note on the interpretation of high-resolution records from organic-rich lakes. Journal of Asian Earth Sciences, 40 (6), 1250-1256. (doi:10.1016/j.jseaes.2010.06.002).

Record type: Article

Abstract

X-ray fluorescence (XRF) scanning of unlithified, untreated sediment cores is becoming an increasingly common method used to obtain paleoproxy data from lake records. XRF-scanning is fast and delivers high-resolution records of relative variations in the elemental composition of the sediment. However, lake sediments display extreme variations in their organic matter content, which can vary from just a few percent to well over 50%. As XRF scanners are largely insensitive to organic material in the sediment, increasing levels of organic material effectively dilute those components that can be measured, such as the lithogenic material (the closed-sum effect). Consequently, in sediments with large variations in organic material, the measured variations in an element will to a large extent mirror the changes in organic material. It is therefore necessary to normalize the elements in the lithogenic component of the sediment against a conservative element to allow changes in the input of the elements to be addressed. In this study we show that Al, which is the lightest element that can be measured using the Itrax XRF-scanner, can be used to effectively normalize the elements of the lithogenic fraction of the sediment against variations in organic content. We also show that care must be taken when choosing resolution and exposure time to ensure optimal output from the measurements.

This record has no associated files available for download.

More information

Published date: 2 April 2011
Keywords: XRF-scanning, Normalization, Lake sediment

Identifiers

Local EPrints ID: 183817
URI: http://eprints.soton.ac.uk/id/eprint/183817
ISSN: 0743-9547
PURE UUID: b84f8a02-f652-4eba-9f78-76fe5cca2d1a

Catalogue record

Date deposited: 03 May 2011 14:16
Last modified: 26 Nov 2021 00:19

Export record

Altmetrics

Contributors

Author: L. Löwemark
Author: H.-F. Chen
Author: T.-N. Yang
Author: M. Kylander
Author: E.-F. Yu
Author: Y.-W. Hsu
Author: T.-Q. Lee
Author: S.-R. Song
Author: S. Jarvis

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×