Polycrystalline silicon optical fibers with atomically smooth surfaces

Healy, Noel, Lagonigro, Laura, Sparks, Justin R., Boden, Stuart, Sazio, Pier J.A., Badding, John V. and Peacock, Anna C. (2011) Polycrystalline silicon optical fibers with atomically smooth surfaces Optics Letters, 36, (13), pp. 2480-2482. (doi:10.1364/OL.36.002480).


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We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the core–cladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ±0.1nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications

Item Type: Article
Digital Object Identifier (DOI): doi:10.1364/OL.36.002480
ISSNs: 0146-9592 (print)
Related URLs:
Subjects: Q Science > QC Physics
Organisations: Optoelectronics Research Centre
ePrint ID: 192525
Date :
Date Event
July 2011Published
Date Deposited: 05 Jul 2011 13:25
Last Modified: 22 Apr 2017 01:49
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/192525

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