Polycrystalline silicon optical fibers with atomically smooth surfaces

Healy, Noel, Lagonigro, Laura, Sparks, Justin R., Boden, Stuart, Sazio, Pier J.A., Badding, John V. and Peacock, Anna C. (2011) Polycrystalline silicon optical fibers with atomically smooth surfaces. Optics Letters, 36 (13), 2480-2482.

Abstract

We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the core–cladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ±0.1nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications

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Contributors

Author: Pier J.A. Sazio

Author: Anna C. Peacock

University divisions

• Faculties (pre 2018 reorg) > Faculty of Physical Sciences and Engineering (pre 2018 reorg) > Optoelectronics Research Centre (pre 2018 reorg)
  Current Faculties > Faculty of Engineering and Physical Sciences > Zepler Institute for Photonics and Nanoelectronics > Optoelectronics Research Centre (pre 2018 reorg)
  Zepler Institute for Photonics and Nanoelectronics > Optoelectronics Research Centre (pre 2018 reorg)

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