Healy, Noel, Lagonigro, Laura, Sparks, Justin R., Boden, Stuart, Sazio, Pier J.A., Badding, John V. and Peacock, Anna C. (2011) Polycrystalline silicon optical fibers with atomically smooth surfaces Optics Letters, 36, (13), pp. 2480-2482. (doi:10.1364/OL.36.002480).
Abstract
We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the core–cladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ±0.1nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications
Full text not available from this repository.
More information
Identifiers
Catalogue record
Export record
Altmetrics
Contributors
University divisions
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.