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Polycrystalline silicon optical fibers with atomically smooth surfaces

Healy, Noel, Lagonigro, Laura, Sparks, Justin R., Boden, Stuart, Sazio, Pier J.A., Badding, John V. and Peacock, Anna C. (2011) Polycrystalline silicon optical fibers with atomically smooth surfaces Optics Letters, 36, (13), pp. 2480-2482.

Record type: Article


We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the core–cladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ±0.1nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications

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Published date: July 2011
Organisations: Optoelectronics Research Centre


Local EPrints ID: 192525
ISSN: 0146-9592
PURE UUID: 4fdc27d6-56df-41fe-b548-526f1805f9fd
ORCID for Pier J.A. Sazio: ORCID iD
ORCID for Anna C. Peacock: ORCID iD

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Date deposited: 05 Jul 2011 13:25
Last modified: 30 Sep 2017 13:22

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Author: Noel Healy
Author: Laura Lagonigro
Author: Justin R. Sparks
Author: Stuart Boden
Author: Pier J.A. Sazio ORCID iD
Author: John V. Badding
Author: Anna C. Peacock ORCID iD

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