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Bringing time resolution to EXAFS: recent developments and application to chemical systems

Bringing time resolution to EXAFS: recent developments and application to chemical systems
Bringing time resolution to EXAFS: recent developments and application to chemical systems
The currently available methodologies for applying extended X-ray absorption fine structure (EXAFS) spectroscopy to the interrogation of dynamic chemical systems are critically reviewed. Particular regard is paid to applicable experimental timescales, extraction of structural information, sample presentation, and simultaneous pairing with complementary techniques; the potential for further developments in this area is also assessed.
x-ray-absorption, energy-dispersive exafs, in-situ, structural information, oxide formation, resolved exafs, spectroscopy, catalyst, diffraction, xas
0306-0012
83-95
Newton, Mark A.
73aab2af-4641-47f3-89ad-3b7d3026164f
Dent, Andrew J.
24c2a218-cb0e-4193-af0b-3ff1dc42b552
Evans, John
05890433-0155-49fe-a65d-38c90ea25c69
Newton, Mark A.
73aab2af-4641-47f3-89ad-3b7d3026164f
Dent, Andrew J.
24c2a218-cb0e-4193-af0b-3ff1dc42b552
Evans, John
05890433-0155-49fe-a65d-38c90ea25c69

Newton, Mark A., Dent, Andrew J. and Evans, John (2002) Bringing time resolution to EXAFS: recent developments and application to chemical systems. Chemical Society Reviews, 31 (2), 83-95. (doi:10.1039/b100115a).

Record type: Article

Abstract

The currently available methodologies for applying extended X-ray absorption fine structure (EXAFS) spectroscopy to the interrogation of dynamic chemical systems are critically reviewed. Particular regard is paid to applicable experimental timescales, extraction of structural information, sample presentation, and simultaneous pairing with complementary techniques; the potential for further developments in this area is also assessed.

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More information

Published date: 2002
Keywords: x-ray-absorption, energy-dispersive exafs, in-situ, structural information, oxide formation, resolved exafs, spectroscopy, catalyst, diffraction, xas

Identifiers

Local EPrints ID: 19830
URI: http://eprints.soton.ac.uk/id/eprint/19830
ISSN: 0306-0012
PURE UUID: b43f7dd2-a438-4fd9-b377-214b6adf4dab

Catalogue record

Date deposited: 22 Feb 2006
Last modified: 08 Jan 2022 12:50

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Contributors

Author: Mark A. Newton
Author: Andrew J. Dent
Author: John Evans

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