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Advances in the Raman depth profiling of polymer laminates

Advances in the Raman depth profiling of polymer laminates
Advances in the Raman depth profiling of polymer laminates
The use of Raman microspectroscopy to depth profile multi-layered polymer laminates is becoming increasingly popular. However, the results are generally degraded by aberrations introduced by the change in refractive index at the air/sample interface. Recent research has suggested that the use of an immersion oil and suitable objective can reduce this effect. This study evaluates this proposal by comparing depth profiling results on a multi-layer poly(styrene)/poly(methylmethacrylate) (PS/PMMA) laminate polymer from both dry metallurgical objectives and immersion objectives (used in combination with an oil of suitable refractive index). The immersion technique enabled successful depth profiling to the full working distance of the objective (100µm), showing clear and distinct variations in 11 different layers within the laminate; a dry metallurgical objective used for comparison achieved poor resolution of only two layers. This is the first demonstration of depth profiling within a polymer laminate to this depth. The depth profiling results are compared to results obtained by sectioning the PS/PMMA sample after setting it in resin.
confocal raman microscopy, depth resolution, refraction, depthprofiling, oil immersion, polymer laminates, cross-sectioning, microspectroscopy, microscopy, resolution
0003-7028
1468-1474
Froud, C.A.
516351fa-45f9-4566-aa2b-71776e7d5ede
Hayward, I.P.
163f328d-47e3-43b4-ad19-56493ecb4159
Laven, J.
1725d700-2663-46f6-8a83-bd8d66c30818
Froud, C.A.
516351fa-45f9-4566-aa2b-71776e7d5ede
Hayward, I.P.
163f328d-47e3-43b4-ad19-56493ecb4159
Laven, J.
1725d700-2663-46f6-8a83-bd8d66c30818

Froud, C.A., Hayward, I.P. and Laven, J. (2003) Advances in the Raman depth profiling of polymer laminates. Applied Spectroscopy, 57 (12), 1468-1474. (doi:10.1366/000370203322640099). (PMID:14686767)

Record type: Article

Abstract

The use of Raman microspectroscopy to depth profile multi-layered polymer laminates is becoming increasingly popular. However, the results are generally degraded by aberrations introduced by the change in refractive index at the air/sample interface. Recent research has suggested that the use of an immersion oil and suitable objective can reduce this effect. This study evaluates this proposal by comparing depth profiling results on a multi-layer poly(styrene)/poly(methylmethacrylate) (PS/PMMA) laminate polymer from both dry metallurgical objectives and immersion objectives (used in combination with an oil of suitable refractive index). The immersion technique enabled successful depth profiling to the full working distance of the objective (100µm), showing clear and distinct variations in 11 different layers within the laminate; a dry metallurgical objective used for comparison achieved poor resolution of only two layers. This is the first demonstration of depth profiling within a polymer laminate to this depth. The depth profiling results are compared to results obtained by sectioning the PS/PMMA sample after setting it in resin.

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More information

Published date: 2003
Keywords: confocal raman microscopy, depth resolution, refraction, depthprofiling, oil immersion, polymer laminates, cross-sectioning, microspectroscopy, microscopy, resolution
Organisations: Optoelectronics Research Centre, Chemistry

Identifiers

Local EPrints ID: 19953
URI: http://eprints.soton.ac.uk/id/eprint/19953
ISSN: 0003-7028
PURE UUID: f6226b1e-762e-4d24-82de-13647789baa0

Catalogue record

Date deposited: 24 Feb 2006
Last modified: 26 Apr 2022 22:18

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Contributors

Author: C.A. Froud
Author: I.P. Hayward
Author: J. Laven

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