Second harmonic ellipsometry
Second harmonic ellipsometry
Apparatus suitable for variable wavelength and incident angle second harmonic ellipsometry (SHE) studies of solid and liquid interfaces is introduced, with particular attention drawn to the calibration of the experiment. Preliminary results obtained from the study of the chiral molecule 1, 1'-bi-2-naphthol located at the air/water interface are used to indicate the suitability of SHE as a surface probe for resonant systems including the determination of the interfacial refractive index at the harmonic frequency.
ellipsometry, second harmonic generation, interface, surface layer, chiralcircular-dichroism spectroscopy, optical susceptibility x(2), sum-frequency generation, chiral thin-films, surface-layers, interfaces, monolayers, reflection
508-515
Timson, Andrew J.
16934284-c14e-4bb9-998f-bfeec0ec0c19
Spencer-Smith, Roland D.
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Alexander, Alexander K.
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Greef, Robert
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Frey, Jeremy G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
1 April 2003
Timson, Andrew J.
16934284-c14e-4bb9-998f-bfeec0ec0c19
Spencer-Smith, Roland D.
26459c31-8cd8-4000-a5c6-1a34419ecae2
Alexander, Alexander K.
a0abf6b9-d07e-43a7-92f6-dde64b68870e
Greef, Robert
91063544-ed89-4738-b5f4-28a984bf5866
Frey, Jeremy G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Timson, Andrew J., Spencer-Smith, Roland D., Alexander, Alexander K., Greef, Robert and Frey, Jeremy G.
(2003)
Second harmonic ellipsometry.
Measurement Science and Technology, 14 (4), .
(doi:10.1088/0957-0233/14/4/315).
Abstract
Apparatus suitable for variable wavelength and incident angle second harmonic ellipsometry (SHE) studies of solid and liquid interfaces is introduced, with particular attention drawn to the calibration of the experiment. Preliminary results obtained from the study of the chiral molecule 1, 1'-bi-2-naphthol located at the air/water interface are used to indicate the suitability of SHE as a surface probe for resonant systems including the determination of the interfacial refractive index at the harmonic frequency.
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Published date: 1 April 2003
Keywords:
ellipsometry, second harmonic generation, interface, surface layer, chiralcircular-dichroism spectroscopy, optical susceptibility x(2), sum-frequency generation, chiral thin-films, surface-layers, interfaces, monolayers, reflection
Identifiers
Local EPrints ID: 20091
URI: http://eprints.soton.ac.uk/id/eprint/20091
ISSN: 0957-0233
PURE UUID: 7645d346-a808-4cdd-9df2-f0b6dc03b38f
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Date deposited: 23 Feb 2006
Last modified: 16 Mar 2024 02:34
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Contributors
Author:
Andrew J. Timson
Author:
Roland D. Spencer-Smith
Author:
Alexander K. Alexander
Author:
Robert Greef
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