Field-induced alignment of a smectic-A phase: a time-resolved x-ray diffraction investigation

Bras, W., Emsley, J.W., Levine, Y.K., Luckhurst, G.R., Seddon, J.M. and Timimi, B.A. (2004) Field-induced alignment of a smectic-A phase: a time-resolved x-ray diffraction investigation. The Journal of Chemical Physics, 121 (9), 4397-4413. (doi:10.1063/1.1776116#).

Abstract

The field-induced alignment of a smectic-A phase is, in principle, a complicated process involving the director rotation via the interaction with the field and the layer rotation via the molecular interactions. Time-resolved nuclear magnetic resonance spectroscopy has revealed this complexity in the case of the director alignment, but provides no direct information on the motion of the layers. Here we describe a time-resolved x-ray diffraction experiment using synchrotron radiation to solve the challenging problem of capturing the diffraction pattern on a time scale which is fast in comparison with that for the alignment of the smectic layers. We have investigated the alignment of the smectic-A phase of 4-octyl-4'-cyanobiphenyl by a magnetic field. The experiment consists of creating a monodomain sample of the smectic-A phase by slow cooling from the nematic phase in a magnetic field with a flux density of 7 T. The sample is then turned quickly through an angle phi(o) about an axis parallel to the x-ray beam direction but orthogonal to the field. A sequence of two-dimensional small angle x-ray diffraction patterns are then collected at short time intervals. Experiments were carried out for different values of phi(o), and at different temperatures. The results show that the alignment behavior changes fundamentally when phi(o) exceeds 45degrees, and that there is a sharp change in the alignment process when the temperature is less than 3 degreesC below the smectic-A-nematic transition. The results of the x-ray experiments are in broad agreement with the NMR results, but reveal major phenomena concerning the maintenance of the integrity of the smectic-A layer structure during the alignment process.

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