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Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography

Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography
Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography
This paper reports the design, installation and testing of a set of multilayer confocal mirrors in a side-by-side arrangement, built to increase the intensity from a molybdenum rotating-anode X-ray source. Ray-tracing experiments were performed in order to evaluate the best design parameters for the system, which are shown to be a side-by-side configuration of 100 mm length. Measurements of the primary beam intensity show an increase by a factor of approximately five. Comparative data collections were performed which highlight significant enhancements in the derived crystal structure, arising from the increased intensity of the primary beam.
x-ray-diffraction
0021-8898
988-992
Coles, Simon J.
3116f58b-c30c-48cf-bdd5-397d1c1fecf8
Hursthouse, Michael B.
57a2ddf9-b1b3-4f38-bfe9-ef2f526388da
Coles, Simon J.
3116f58b-c30c-48cf-bdd5-397d1c1fecf8
Hursthouse, Michael B.
57a2ddf9-b1b3-4f38-bfe9-ef2f526388da

Coles, Simon J. and Hursthouse, Michael B. (2004) Focusing optics for molybdenum radiation: a bright laboratory source for small-molecule crystallography. Journal of Applied Crystallography, 37 (6), 988-992. (doi:10.1107/S0021889804025166).

Record type: Article

Abstract

This paper reports the design, installation and testing of a set of multilayer confocal mirrors in a side-by-side arrangement, built to increase the intensity from a molybdenum rotating-anode X-ray source. Ray-tracing experiments were performed in order to evaluate the best design parameters for the system, which are shown to be a side-by-side configuration of 100 mm length. Measurements of the primary beam intensity show an increase by a factor of approximately five. Comparative data collections were performed which highlight significant enhancements in the derived crystal structure, arising from the increased intensity of the primary beam.

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More information

Published date: 1 December 2004
Keywords: x-ray-diffraction

Identifiers

Local EPrints ID: 20173
URI: http://eprints.soton.ac.uk/id/eprint/20173
ISSN: 0021-8898
PURE UUID: eba1f9f9-6395-409a-bcd4-35a4551e8d22
ORCID for Simon J. Coles: ORCID iD orcid.org/0000-0001-8414-9272

Catalogue record

Date deposited: 20 Feb 2006
Last modified: 16 Mar 2024 03:05

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