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Determination of spatio-spectral properties of individual modes within multimode waveguides using spectrally resolved near-field scanning optical microscopy

Determination of spatio-spectral properties of individual modes within multimode waveguides using spectrally resolved near-field scanning optical microscopy
Determination of spatio-spectral properties of individual modes within multimode waveguides using spectrally resolved near-field scanning optical microscopy
Near-field scanning optical microscopy (NSOM) is used to measure the relative group velocity and relative amplitude of modes in a multimode waveguide with an incoherent broadband light source. A spectrally resolving NSOM probe was used to observe localized spectral interference in the multimode waveguide. Fourier analysis was used to identify temporal delays. The modes can be further identified by their temporally discriminated spatial profile which is based on the product of their fields. This data provide the relative amplitude and phases of the modes.
fourier analysis, integrated optics, light interference, optical microscopy, optical waveguides
0003-6951
Berry, S.A.
0f768f48-36c4-4599-8917-7aae657378a7
Gates, J.C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Berry, S.A.
0f768f48-36c4-4599-8917-7aae657378a7
Gates, J.C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67

Berry, S.A., Gates, J.C. and Brocklesby, W.S. (2011) Determination of spatio-spectral properties of individual modes within multimode waveguides using spectrally resolved near-field scanning optical microscopy. Applied Physics Letters, 99 (14). (doi:10.1063/1.3647620).

Record type: Article

Abstract

Near-field scanning optical microscopy (NSOM) is used to measure the relative group velocity and relative amplitude of modes in a multimode waveguide with an incoherent broadband light source. A spectrally resolving NSOM probe was used to observe localized spectral interference in the multimode waveguide. Fourier analysis was used to identify temporal delays. The modes can be further identified by their temporally discriminated spatial profile which is based on the product of their fields. This data provide the relative amplitude and phases of the modes.

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More information

Published date: 3 October 2011
Keywords: fourier analysis, integrated optics, light interference, optical microscopy, optical waveguides
Organisations: Optoelectronics Research Centre

Identifiers

Local EPrints ID: 205585
URI: https://eprints.soton.ac.uk/id/eprint/205585
ISSN: 0003-6951
PURE UUID: 1749bf70-be97-4ce8-ad97-aefcf4407dae
ORCID for S.A. Berry: ORCID iD orcid.org/0000-0002-9538-8655
ORCID for J.C. Gates: ORCID iD orcid.org/0000-0001-8671-5987
ORCID for W.S. Brocklesby: ORCID iD orcid.org/0000-0002-2123-6712

Catalogue record

Date deposited: 12 Dec 2011 15:29
Last modified: 20 Jul 2019 01:25

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