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The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths

The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths
The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths
We demonstrate the potential of X-ray photo-emission electron microscopy (XPEEM) to reveal valence-state images of the spatial distribution and relative concentration of metals in specific oxidation states. Additionally, XPEEM allows X-ray absorption spectra to be extracted from chosen pixel areas of the images. Using an in-house-built XPEEM instrument we show an application of the method in providing valence-state images of complex mineral intergrowths. The image resolution achieved with this instrument of simple design was similar to5 mum, and reasonable quality X-ray absorption spectra were extracted from areas of similar to5 x 5 mum. These initial results suggest that by using commercial XPEEM instruments on 3(rd) generation. high-brightness, synchrotron sources a spatial resolution of 100 urn or better could be achieved, with the ability to extract high-quality X-ray absorption spectra from areas of 0.1 mum(2). Given that standard thin sections or polished blocks can be studied by XPEEM. and that each XPEEM image records similar to1000 mum(2), XPEEM can be used in conjunction with other analytical methods such as EMPA and TEM-EELS/PEELS.
x-ray photo-emission electron microscopy, xpeem, valence-state imagine, xas, crystal chemistryabsorption-spectroscopy, synchrotron-radiation, spatial-resolution, undulator beamline, oxidation-state, srs, performance, daresbury, copper, iron
0026-461X
859-869
Smith, A.D.
5f9e0088-dded-4e42-9106-32c97dbcc964
Schofield, P.F.
6ecfc5d3-ac67-482b-baf3-b6d3f7f6b085
Cressey, G.
22180b0c-9ec7-4dad-a64a-d39b3a3fe990
Cressey, B A.
55c72b25-9179-4338-ac8f-c71f7613d44e
Read, P.D.
02b2b069-d8fd-4e2c-9608-e1faeab8b236
Smith, A.D.
5f9e0088-dded-4e42-9106-32c97dbcc964
Schofield, P.F.
6ecfc5d3-ac67-482b-baf3-b6d3f7f6b085
Cressey, G.
22180b0c-9ec7-4dad-a64a-d39b3a3fe990
Cressey, B A.
55c72b25-9179-4338-ac8f-c71f7613d44e
Read, P.D.
02b2b069-d8fd-4e2c-9608-e1faeab8b236

Smith, A.D., Schofield, P.F., Cressey, G., Cressey, B A. and Read, P.D. (2004) The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths. Mineralogical Magazine, 68 (6), 859-869. (doi:10.1180/0026461046860228).

Record type: Article

Abstract

We demonstrate the potential of X-ray photo-emission electron microscopy (XPEEM) to reveal valence-state images of the spatial distribution and relative concentration of metals in specific oxidation states. Additionally, XPEEM allows X-ray absorption spectra to be extracted from chosen pixel areas of the images. Using an in-house-built XPEEM instrument we show an application of the method in providing valence-state images of complex mineral intergrowths. The image resolution achieved with this instrument of simple design was similar to5 mum, and reasonable quality X-ray absorption spectra were extracted from areas of similar to5 x 5 mum. These initial results suggest that by using commercial XPEEM instruments on 3(rd) generation. high-brightness, synchrotron sources a spatial resolution of 100 urn or better could be achieved, with the ability to extract high-quality X-ray absorption spectra from areas of 0.1 mum(2). Given that standard thin sections or polished blocks can be studied by XPEEM. and that each XPEEM image records similar to1000 mum(2), XPEEM can be used in conjunction with other analytical methods such as EMPA and TEM-EELS/PEELS.

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More information

Published date: 1 December 2004
Keywords: x-ray photo-emission electron microscopy, xpeem, valence-state imagine, xas, crystal chemistryabsorption-spectroscopy, synchrotron-radiation, spatial-resolution, undulator beamline, oxidation-state, srs, performance, daresbury, copper, iron

Identifiers

Local EPrints ID: 20912
URI: http://eprints.soton.ac.uk/id/eprint/20912
ISSN: 0026-461X
PURE UUID: b3f0605c-3966-49cb-868f-94f16b638c60

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Date deposited: 01 Mar 2006
Last modified: 15 Jul 2019 19:25

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Contributors

Author: A.D. Smith
Author: P.F. Schofield
Author: G. Cressey
Author: B A. Cressey
Author: P.D. Read

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