Investigation of roughness induced crack closure effects in fatigue
Investigation of roughness induced crack closure effects in fatigue
The incidence of roughness induced fatigue crack closure has been studied by finite element modelling.
Results show an increasing effect of crack path angle on closure levels with the closure mechanism being strongly dependent on residual plastic strains in the wake rather than global shear displacements of the fracture surfaces.
An analytical expression for the functional dependence of roughness induced closure has been produced which shows reasonable agreement with the finite element results.
1853128120
313-322
Wessex Institute of Technology
Parry, M.R.
a16a4522-52e5-4f09-ae01-7d7af62d5e5b
Syngellakis, S.
1279f4e2-97ec-44dc-b4c2-28f5ac9c2f88
Sinclair, I.
6005f6c1-f478-434e-a52d-d310c18ade0d
2000
Parry, M.R.
a16a4522-52e5-4f09-ae01-7d7af62d5e5b
Syngellakis, S.
1279f4e2-97ec-44dc-b4c2-28f5ac9c2f88
Sinclair, I.
6005f6c1-f478-434e-a52d-d310c18ade0d
Parry, M.R., Syngellakis, S. and Sinclair, I.
(2000)
Investigation of roughness induced crack closure effects in fatigue.
In,
Selvadurai, A.P.S. and Brebbia, C.A.
(eds.)
Damage and Fracture Mechanics VI: Computer Aided Assessment and Control.
(Engineering Sciences, 26)
Southampton, UK.
Wessex Institute of Technology, .
(doi:10.2495/DM000291).
Record type:
Book Section
Abstract
The incidence of roughness induced fatigue crack closure has been studied by finite element modelling.
Results show an increasing effect of crack path angle on closure levels with the closure mechanism being strongly dependent on residual plastic strains in the wake rather than global shear displacements of the fracture surfaces.
An analytical expression for the functional dependence of roughness induced closure has been produced which shows reasonable agreement with the finite element results.
Text
parr_00.pdf
- Accepted Manuscript
More information
Published date: 2000
Identifiers
Local EPrints ID: 21406
URI: http://eprints.soton.ac.uk/id/eprint/21406
ISBN: 1853128120
PURE UUID: 0a3872b3-54be-40ce-9497-8af5eb222e89
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Date deposited: 23 Feb 2007
Last modified: 15 Mar 2024 06:30
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Contributors
Author:
M.R. Parry
Author:
S. Syngellakis
Editor:
A.P.S. Selvadurai
Editor:
C.A. Brebbia
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