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Arc root commutation from moving contacts in low voltage devices

Arc root commutation from moving contacts in low voltage devices
Arc root commutation from moving contacts in low voltage devices
This paper focuses on the arc commutation from a moving contact and in particular on the anode motion of a high current arc in low voltage current limiting circuit breakers. Recent investigations have observed that the anode arc root motion is affected by arc chamber geometry. It was previously assumed that cathode root motion was the dominant process. The study uses a flexible test apparatus with a solid state high speed imaging system. The experimental results presented show the influence of arc chamber venting, current level, current polarity and contact velocity on arc motion, and particular emphasis is given to the anode motion. The physical process occurring in the anode root are discussed and related to the observed motion. The results show that the anode root is retarded at the tip of the moving contact and that this is primarily related to the venting process in the arc chamber.
0780359607
130-138
IEEE
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Pechrach, K.
58bf3627-cfd9-4909-a76b-d236bfdcadca
Weaver, P.M.
649cbff1-3909-4d09-bab6-79ef325089d0
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Pechrach, K.
58bf3627-cfd9-4909-a76b-d236bfdcadca
Weaver, P.M.
649cbff1-3909-4d09-bab6-79ef325089d0

McBride, J.W., Pechrach, K. and Weaver, P.M. (2000) Arc root commutation from moving contacts in low voltage devices. In Proceedings of the Forty-Sixth IEEE Holm Conference on Electrical Contacts, 2000. IEEE. pp. 130-138 . (doi:10.1109/HOLM.2000.889922).

Record type: Conference or Workshop Item (Paper)

Abstract

This paper focuses on the arc commutation from a moving contact and in particular on the anode motion of a high current arc in low voltage current limiting circuit breakers. Recent investigations have observed that the anode arc root motion is affected by arc chamber geometry. It was previously assumed that cathode root motion was the dominant process. The study uses a flexible test apparatus with a solid state high speed imaging system. The experimental results presented show the influence of arc chamber venting, current level, current polarity and contact velocity on arc motion, and particular emphasis is given to the anode motion. The physical process occurring in the anode root are discussed and related to the observed motion. The results show that the anode root is retarded at the tip of the moving contact and that this is primarily related to the venting process in the arc chamber.

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More information

Published date: 6 September 2000
Venue - Dates: Forty-Sixth IEEE Holm Conference on Electrical Contacts, Chicago, USA, 2000-09-25 - 2000-09-27

Identifiers

Local EPrints ID: 21431
URI: http://eprints.soton.ac.uk/id/eprint/21431
ISBN: 0780359607
PURE UUID: 3d32c840-feb7-45eb-966d-8ebe868aaecb
ORCID for J.W. McBride: ORCID iD orcid.org/0000-0002-3024-0326

Catalogue record

Date deposited: 21 Feb 2007
Last modified: 16 Mar 2024 02:37

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Contributors

Author: J.W. McBride ORCID iD
Author: K. Pechrach
Author: P.M. Weaver

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