A contribution to the debate on the resistance-temperature characteristics of thick-film resistor materials
A contribution to the debate on the resistance-temperature characteristics of thick-film resistor materials
The almost parabolic resistance–temperature characteristic shown by a thick-film resistor material (Heraeus 8241), printed on an alumina substrate, is explained in terms of thermal expansion effects in the x, y and z directions between 77 and 535 K. The piezoresistive equation is used to strip the thermal expansion contribution from the almost parabolic resistance–temperature characteristic, leaving a near linear resistance–temperature characteristic. It is suggested that the point of inflection on the resistance–temperature characteristic is primarily due to the non-linear temperature coefficient of expansivity of alumina
thick-film, resistance, temperature, piezoresistive
52-57
Fawcett, Nigel
f76a7824-04a8-47ed-97be-8d11bb51aaf8
Hill, Martyn
0cda65c8-a70f-476f-b126-d2c4460a253e
2000
Fawcett, Nigel
f76a7824-04a8-47ed-97be-8d11bb51aaf8
Hill, Martyn
0cda65c8-a70f-476f-b126-d2c4460a253e
Fawcett, Nigel and Hill, Martyn
(2000)
A contribution to the debate on the resistance-temperature characteristics of thick-film resistor materials.
Sensors and Actuators A: Physical, 86 (1-2), .
(doi:10.1016/S0924-4247(00)00425-8).
Abstract
The almost parabolic resistance–temperature characteristic shown by a thick-film resistor material (Heraeus 8241), printed on an alumina substrate, is explained in terms of thermal expansion effects in the x, y and z directions between 77 and 535 K. The piezoresistive equation is used to strip the thermal expansion contribution from the almost parabolic resistance–temperature characteristic, leaving a near linear resistance–temperature characteristic. It is suggested that the point of inflection on the resistance–temperature characteristic is primarily due to the non-linear temperature coefficient of expansivity of alumina
This record has no associated files available for download.
More information
Published date: 2000
Keywords:
thick-film, resistance, temperature, piezoresistive
Identifiers
Local EPrints ID: 21452
URI: http://eprints.soton.ac.uk/id/eprint/21452
ISSN: 0924-4247
PURE UUID: ae1f845f-464f-4bd6-a3c9-81aafdb1f1b1
Catalogue record
Date deposited: 06 Feb 2007
Last modified: 16 Mar 2024 02:40
Export record
Altmetrics
Contributors
Author:
Nigel Fawcett
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics
