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A contribution to the debate on the resistance-temperature characteristics of thick-film resistor materials

A contribution to the debate on the resistance-temperature characteristics of thick-film resistor materials
A contribution to the debate on the resistance-temperature characteristics of thick-film resistor materials
The almost parabolic resistance–temperature characteristic shown by a thick-film resistor material (Heraeus 8241), printed on an alumina substrate, is explained in terms of thermal expansion effects in the x, y and z directions between 77 and 535 K. The piezoresistive equation is used to strip the thermal expansion contribution from the almost parabolic resistance–temperature characteristic, leaving a near linear resistance–temperature characteristic. It is suggested that the point of inflection on the resistance–temperature characteristic is primarily due to the non-linear temperature coefficient of expansivity of alumina
thick-film, resistance, temperature, piezoresistive
0924-4247
52-57
Fawcett, Nigel
f76a7824-04a8-47ed-97be-8d11bb51aaf8
Hill, Martyn
0cda65c8-a70f-476f-b126-d2c4460a253e
Fawcett, Nigel
f76a7824-04a8-47ed-97be-8d11bb51aaf8
Hill, Martyn
0cda65c8-a70f-476f-b126-d2c4460a253e

Fawcett, Nigel and Hill, Martyn (2000) A contribution to the debate on the resistance-temperature characteristics of thick-film resistor materials. Sensors and Actuators A: Physical, 86 (1-2), 52-57. (doi:10.1016/S0924-4247(00)00425-8).

Record type: Article

Abstract

The almost parabolic resistance–temperature characteristic shown by a thick-film resistor material (Heraeus 8241), printed on an alumina substrate, is explained in terms of thermal expansion effects in the x, y and z directions between 77 and 535 K. The piezoresistive equation is used to strip the thermal expansion contribution from the almost parabolic resistance–temperature characteristic, leaving a near linear resistance–temperature characteristic. It is suggested that the point of inflection on the resistance–temperature characteristic is primarily due to the non-linear temperature coefficient of expansivity of alumina

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More information

Published date: 2000
Keywords: thick-film, resistance, temperature, piezoresistive

Identifiers

Local EPrints ID: 21452
URI: https://eprints.soton.ac.uk/id/eprint/21452
ISSN: 0924-4247
PURE UUID: ae1f845f-464f-4bd6-a3c9-81aafdb1f1b1
ORCID for Martyn Hill: ORCID iD orcid.org/0000-0001-6448-9448

Catalogue record

Date deposited: 06 Feb 2007
Last modified: 06 Jun 2018 13:12

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