McNally, P.J., Dilliway, G., Bonar, J.M., Willoughby, A.F.W., Tuomi, T., Rantamaki, R., Danilewsky, A.N. and Lowney, D. (2000) Observations of misfit dislocation strain-induced surface features for a SiGe-Si heterostructure using total reflection x-ray topography. Physica Status Solidi A-Applied Research, 180 (1), R1-R3. (doi:10.1002/1521-396X(200007)180:1<R1::AID-PSSA99991>3.0.CO;2-B).
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Published date: 2000
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Local EPrints ID: 21486
URI: http://eprints.soton.ac.uk/id/eprint/21486
ISSN: 0031-8965
PURE UUID: 9a1f57ea-4e4d-4208-a330-336cff1f1bfa
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Date deposited: 07 Feb 2007
Last modified: 15 Mar 2024 06:30
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Contributors
Author:
P.J. McNally
Author:
G. Dilliway
Author:
J.M. Bonar
Author:
A.F.W. Willoughby
Author:
T. Tuomi
Author:
R. Rantamaki
Author:
A.N. Danilewsky
Author:
D. Lowney
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