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Effects of aspect ratio on the temperature coefficient of resistance matching and low frequency noise levels in thick film strain sensors

Effects of aspect ratio on the temperature coefficient of resistance matching and low frequency noise levels in thick film strain sensors
Effects of aspect ratio on the temperature coefficient of resistance matching and low frequency noise levels in thick film strain sensors
An experimental study of thick film strain sensitive resistors as typically employed in resistive bridge interface circuits has been undertaken. It has been found that the chosen aspect ratio (length to width ratio) of these screen printed and fired thick film resistors has a significant effect on both the temperature coefficient of resistance and the low frequency noise characteristics of the devices. This sensitivity to aspect ratio has been attributed to metal end contact migration in the devices during firing and hence a relationship between the sensitivity and the choice of end contact material and the firing regime employed in device
noise levels, screen printing, strain analysis, thick film
1356-5362
40-43
Atkinson, J.K.
5e9729b2-0e1f-400d-a889-c74f6390ea58
Sion, R.
b0827194-90e6-4d23-9c82-a886c3ca419e
Zhang, Z.
9f10922d-6793-4f6f-89e4-aa0125bb16ee
Atkinson, J.K.
5e9729b2-0e1f-400d-a889-c74f6390ea58
Sion, R.
b0827194-90e6-4d23-9c82-a886c3ca419e
Zhang, Z.
9f10922d-6793-4f6f-89e4-aa0125bb16ee

Atkinson, J.K., Sion, R. and Zhang, Z. (2001) Effects of aspect ratio on the temperature coefficient of resistance matching and low frequency noise levels in thick film strain sensors. Microelectronics International, 18 (1), 40-43. (doi:10.1108/13565360110380107).

Record type: Article

Abstract

An experimental study of thick film strain sensitive resistors as typically employed in resistive bridge interface circuits has been undertaken. It has been found that the chosen aspect ratio (length to width ratio) of these screen printed and fired thick film resistors has a significant effect on both the temperature coefficient of resistance and the low frequency noise characteristics of the devices. This sensitivity to aspect ratio has been attributed to metal end contact migration in the devices during firing and hence a relationship between the sensitivity and the choice of end contact material and the firing regime employed in device

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More information

Published date: 2001
Keywords: noise levels, screen printing, strain analysis, thick film

Identifiers

Local EPrints ID: 21937
URI: http://eprints.soton.ac.uk/id/eprint/21937
ISSN: 1356-5362
PURE UUID: 477c9cb1-1910-4997-b6e1-8f644e65d2c1
ORCID for J.K. Atkinson: ORCID iD orcid.org/0000-0003-3411-8034

Catalogue record

Date deposited: 20 Mar 2006
Last modified: 08 Jan 2022 02:31

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Contributors

Author: J.K. Atkinson ORCID iD
Author: R. Sion
Author: Z. Zhang

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