Ion-implantation and diffusion behaviour of boron in germanium


Uppal, Suresh, Willoughby, A.F.W., Bonar, Janet M., Evans, Alan G.R., Cowern, Nick E.B., Morris, Richard and Dowsett, Mark G. (2001) Ion-implantation and diffusion behaviour of boron in germanium Physica B: Condensed Matter, 308-310, pp. 525-528. (doi:10.1016/S0921-4526(01)00752-9).

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Description/Abstract

Results are presented of implantation and diffusion study of boron (B) in germanium (Ge). B implantation was carried out in Ge with different energies and to different doses. High-resolution secondary ion mass spectroscopy was used to obtain concentration profiles after furnace annealing. The as-implanted profiles show a long tail possibly due to enhanced diffusion. A limited diffusion has been observed after furnace annealing. Using T-SUPREM, diffusivity value of 1.5(±0.3)×10?16 cm2/s at 850°C has been extracted. This value is two orders of magnitude lower than previously reported values. The results question the change in diffusion mechanism of B diffusion in Si–Ge alloys from low Ge levels to high Ge levels.

Item Type: Article
Digital Object Identifier (DOI): doi:10.1016/S0921-4526(01)00752-9
ISSNs: 0921-4526 (print)
Keywords: germanium, boron, ion implantation, diffusion
Subjects:
ePrint ID: 21959
Date :
Date Event
2001Published
Date Deposited: 20 Mar 2006
Last Modified: 16 Apr 2017 22:53
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/21959

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