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A review of surface erosion measurements in low voltage switching devices

A review of surface erosion measurements in low voltage switching devices
A review of surface erosion measurements in low voltage switching devices
462-470
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770

McBride, J.W. (2002) A review of surface erosion measurements in low voltage switching devices. Proceedings of the Twenty First International Conference on Electrical Contacts, Zurich, Switzerland. 08 - 11 Sep 2002. pp. 462-470 .

Record type: Conference or Workshop Item (Paper)

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Published date: 2002
Venue - Dates: Proceedings of the Twenty First International Conference on Electrical Contacts, Zurich, Switzerland, 2002-09-08 - 2002-09-11

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Local EPrints ID: 22092
URI: http://eprints.soton.ac.uk/id/eprint/22092
PURE UUID: f45d8c8a-a549-47d0-9802-a962dcceca8d

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Date deposited: 07 Mar 2007
Last modified: 22 Jul 2020 16:42

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Author: J.W. McBride

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