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A study of some production parameter effects on the resistance-temperature characteristics of thick strain gauges

A study of some production parameter effects on the resistance-temperature characteristics of thick strain gauges
A study of some production parameter effects on the resistance-temperature characteristics of thick strain gauges
Experiments aimed at investigating the possible factors affecting the temperature performance of thick-film resistors are presented. Particular emphasis is given to the temperature coefficient of resistance (TCR) of thick film strain gauges printed on both alumina and stainless steel substrates. The results confirmed that the resistance versus temperature curve is nearly parabolic, but showed that Tmin, the temperature at which the TCR changes to zero, is largely affected by the choice of resistor and substrate materials and also the thickness of the thick-film resistors. A possible explanation is proposed for the observed relationship between resistor thickness and TCR. Other factors, such as the thickness of the substrates, the choice of conductor materials, and whether single- or double-sided printing of the substrate was employed in fabrication were found to make little difference to the temperature performance of the thick-film resistors.
0022-3727
1282-1289
Zheng, Yulan
0b179f94-1c96-4773-8b1e-0f4e5b1fdbeb
Atkinson, John
5e9729b2-0e1f-400d-a889-c74f6390ea58
Sion, Russ
ef48864b-2349-4bf9-a48a-934429e48b3d
Zhang, Zhige
26abc372-3fbe-4774-8086-400c9a1aefaf
Zheng, Yulan
0b179f94-1c96-4773-8b1e-0f4e5b1fdbeb
Atkinson, John
5e9729b2-0e1f-400d-a889-c74f6390ea58
Sion, Russ
ef48864b-2349-4bf9-a48a-934429e48b3d
Zhang, Zhige
26abc372-3fbe-4774-8086-400c9a1aefaf

Zheng, Yulan, Atkinson, John, Sion, Russ and Zhang, Zhige (2002) A study of some production parameter effects on the resistance-temperature characteristics of thick strain gauges. Journal of Physics D: Applied Physics, 35, 1282-1289. (doi:10.1088/0022-3727/35/11/326).

Record type: Article

Abstract

Experiments aimed at investigating the possible factors affecting the temperature performance of thick-film resistors are presented. Particular emphasis is given to the temperature coefficient of resistance (TCR) of thick film strain gauges printed on both alumina and stainless steel substrates. The results confirmed that the resistance versus temperature curve is nearly parabolic, but showed that Tmin, the temperature at which the TCR changes to zero, is largely affected by the choice of resistor and substrate materials and also the thickness of the thick-film resistors. A possible explanation is proposed for the observed relationship between resistor thickness and TCR. Other factors, such as the thickness of the substrates, the choice of conductor materials, and whether single- or double-sided printing of the substrate was employed in fabrication were found to make little difference to the temperature performance of the thick-film resistors.

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Published date: 2002

Identifiers

Local EPrints ID: 22321
URI: http://eprints.soton.ac.uk/id/eprint/22321
ISSN: 0022-3727
PURE UUID: c24286d2-a873-4945-9658-d84ca1674e38
ORCID for John Atkinson: ORCID iD orcid.org/0000-0003-3411-8034

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Date deposited: 20 Mar 2006
Last modified: 26 Nov 2019 02:08

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Contributors

Author: Yulan Zheng
Author: John Atkinson ORCID iD
Author: Russ Sion
Author: Zhige Zhang

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