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On the zero offset stability of thick film strain gauges

On the zero offset stability of thick film strain gauges
On the zero offset stability of thick film strain gauges
This paper presents results of work aimed at characterising the zero offset stability in novel thick film strain gauges. The devices studied are z-axis (k33) load sensors fabricated on insulated stainless steel substrates and include examples of novel commercially developed force sensors. Devices loaded with compressive strains using a purpose designed test jig were found to exhibit a significant zero offset shift, which is negative up to a certain level (typically 1,000?micro strains) and then increasingly positive when strained beyond this point. Repeated cycles of loading then produced a certain level of stability until the previous maximum value of applied strain was exceeded. Temperature coefficient of resistance (TCR) measurements showed the devices to exhibit characteristics that depend significantly on the device geometry. The TCR was found to increase positively with increasing device thickness and surface area. The effect of overglazing the devices was found to decrease the TCR.
stability, strain, temperature, thick film
1356-5362
24-29
Zheng, Yulan
0b179f94-1c96-4773-8b1e-0f4e5b1fdbeb
Atkinson, John
5e9729b2-0e1f-400d-a889-c74f6390ea58
Sion, Russ
ef48864b-2349-4bf9-a48a-934429e48b3d
Zheng, Yulan
0b179f94-1c96-4773-8b1e-0f4e5b1fdbeb
Atkinson, John
5e9729b2-0e1f-400d-a889-c74f6390ea58
Sion, Russ
ef48864b-2349-4bf9-a48a-934429e48b3d

Zheng, Yulan, Atkinson, John and Sion, Russ (2002) On the zero offset stability of thick film strain gauges. Microelectronics International, 19 (3), 24-29. (doi:10.1108/13565360210445014).

Record type: Article

Abstract

This paper presents results of work aimed at characterising the zero offset stability in novel thick film strain gauges. The devices studied are z-axis (k33) load sensors fabricated on insulated stainless steel substrates and include examples of novel commercially developed force sensors. Devices loaded with compressive strains using a purpose designed test jig were found to exhibit a significant zero offset shift, which is negative up to a certain level (typically 1,000?micro strains) and then increasingly positive when strained beyond this point. Repeated cycles of loading then produced a certain level of stability until the previous maximum value of applied strain was exceeded. Temperature coefficient of resistance (TCR) measurements showed the devices to exhibit characteristics that depend significantly on the device geometry. The TCR was found to increase positively with increasing device thickness and surface area. The effect of overglazing the devices was found to decrease the TCR.

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More information

Published date: 2002
Keywords: stability, strain, temperature, thick film

Identifiers

Local EPrints ID: 22333
URI: http://eprints.soton.ac.uk/id/eprint/22333
ISSN: 1356-5362
PURE UUID: 99cee529-f21b-4cae-bb00-edd7b71f5ccd
ORCID for John Atkinson: ORCID iD orcid.org/0000-0003-3411-8034

Catalogue record

Date deposited: 17 Mar 2006
Last modified: 20 Jul 2019 01:29

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