A study of the effect of fabrication parameter variation on the environmental characteristics of thick film strain gauges fabricated on steel substrates
A study of the effect of fabrication parameter variation on the environmental characteristics of thick film strain gauges fabricated on steel substrates
Results from a programme of research aimed at establishing the mechanisms behind the effects of fabrication parameter variation on the performance of thick film strain gauges on steel substrates are presented. The research is aimed at describing the effect on the repeatability of the device characteristics due to different choices of materials, thicknesses of gauges, firing regimes and geometrical orientation of the gauges. In particular the effects of load and temperature on the offset and gain characteristics of a variety of different sensor constructions have been explored. The sensors described here are of a type where the applied strain is parallel to the measured resistance path but orthogonal to the substrate (z[33]). It has been found that these devices exhibit different characteristics to conventional thick film strain gauges that help explain the mechanisms affecting gain and offset changes caused by temperature fluctuations and mechanical deformation.
0819443174
731-735
SPIE - The International Society for Optical Engineering
Zheng, Y.
4f14b365-2ced-4b7c-bc00-d1599153a12e
Atkinson, J.K.
5e9729b2-0e1f-400d-a889-c74f6390ea58
Sion, R.P.
b702a661-c816-44c3-8131-c9bb064d282c
Zhang, Z.
fd968521-9e43-4b50-b67e-3b6dfa095d13
2001
Zheng, Y.
4f14b365-2ced-4b7c-bc00-d1599153a12e
Atkinson, J.K.
5e9729b2-0e1f-400d-a889-c74f6390ea58
Sion, R.P.
b702a661-c816-44c3-8131-c9bb064d282c
Zhang, Z.
fd968521-9e43-4b50-b67e-3b6dfa095d13
Zheng, Y., Atkinson, J.K., Sion, R.P. and Zhang, Z.
(2001)
A study of the effect of fabrication parameter variation on the environmental characteristics of thick film strain gauges fabricated on steel substrates.
In,
International Symposium on Microelectronics.
(Proceedings of SPIE, 4587)
International Symposium on Microelectronics (01/01/01 - 01/01/01)
Bellingham, USA.
SPIE - The International Society for Optical Engineering, .
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Book Section
Abstract
Results from a programme of research aimed at establishing the mechanisms behind the effects of fabrication parameter variation on the performance of thick film strain gauges on steel substrates are presented. The research is aimed at describing the effect on the repeatability of the device characteristics due to different choices of materials, thicknesses of gauges, firing regimes and geometrical orientation of the gauges. In particular the effects of load and temperature on the offset and gain characteristics of a variety of different sensor constructions have been explored. The sensors described here are of a type where the applied strain is parallel to the measured resistance path but orthogonal to the substrate (z[33]). It has been found that these devices exhibit different characteristics to conventional thick film strain gauges that help explain the mechanisms affecting gain and offset changes caused by temperature fluctuations and mechanical deformation.
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Published date: 2001
Additional Information:
Series ISSN 0277-786X
Venue - Dates:
International Symposium on Microelectronics, Baltimore, USA, 2001-01-01 - 2001-01-01
Identifiers
Local EPrints ID: 22336
URI: http://eprints.soton.ac.uk/id/eprint/22336
ISBN: 0819443174
PURE UUID: 03138038-6920-447e-b54b-20a39bcf59b2
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Date deposited: 06 Mar 2007
Last modified: 07 Mar 2024 02:33
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Contributors
Author:
Y. Zheng
Author:
R.P. Sion
Author:
Z. Zhang
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