Fretting corrosion and the reliability of multicontact connector terminals
Fretting corrosion and the reliability of multicontact connector terminals
The harsh operating environment of the automotive application makes the semi-permanent connector susceptible to intermittent high contact resistance which eventually leads to failure. Fretting corrosion is often the cause of these failures. However, laboratory testing of sample contact materials produces results that do not correlate with commercially tested connectors. A multicontact (M-C) reliability model is developed to bring together the fundamental studies and studies conducted on commercially available connector terminals. It is based on fundamental studies of the single contact interfaces and applied to commercial multicontact terminals. The model takes into consideration firstly, that a single contact interface may recover to low contact resistance after attaining a high value and secondly, that a terminal consists of more than one contact interface. For the connector to fail, all contact interfaces have to be in the failed state at the same time.
670-676
Swingler, J.
c6e2a49e-fadd-4f38-99f7-0ee1e2c92fac
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
December 2002
Swingler, J.
c6e2a49e-fadd-4f38-99f7-0ee1e2c92fac
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Swingler, J. and McBride, J.W.
(2002)
Fretting corrosion and the reliability of multicontact connector terminals.
IEEE Transactions on Components and Packaging Technologies, 25 (4), .
(doi:10.1109/TCAPT.2002.808007).
Abstract
The harsh operating environment of the automotive application makes the semi-permanent connector susceptible to intermittent high contact resistance which eventually leads to failure. Fretting corrosion is often the cause of these failures. However, laboratory testing of sample contact materials produces results that do not correlate with commercially tested connectors. A multicontact (M-C) reliability model is developed to bring together the fundamental studies and studies conducted on commercially available connector terminals. It is based on fundamental studies of the single contact interfaces and applied to commercial multicontact terminals. The model takes into consideration firstly, that a single contact interface may recover to low contact resistance after attaining a high value and secondly, that a terminal consists of more than one contact interface. For the connector to fail, all contact interfaces have to be in the failed state at the same time.
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Published date: December 2002
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Local EPrints ID: 22386
URI: http://eprints.soton.ac.uk/id/eprint/22386
ISSN: 1521-3331
PURE UUID: ad9916d8-611a-4bf1-8efc-7e1da9cf7924
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Date deposited: 17 Mar 2006
Last modified: 16 Mar 2024 02:37
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Author:
J. Swingler
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