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An explanation of thermal behaviour of thick film strain gauges

Zheng, Yulan, Atkinson, John and Sion, Russell (2003) An explanation of thermal behaviour of thick film strain gauges Journal of Physics D: Applied Physics, 36, (9), pp. 1153-1158. (doi:10.1088/0022-3727/36/9/314).

Record type: Article


Earlier study shows that resistor thickness of the thick film strain gauge can affect its temperature characteristic, which is usually a roughly parabolic curve. Thicker resistors tend to exhibit a higher positive temperature coefficient of resistance (TCR) and a lower T&min;, the temperature at which the TCR changes to zero in the curve. This paper presents a possible explanation of this observation based on an analysis of strain profiles and resistivity behaviour difference in resistors with different thicknesses subjected to temperature variation.

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Published date: April 2003


Local EPrints ID: 22572
ISSN: 0022-3727
PURE UUID: 2ff000c2-5612-4aff-a525-6fd41036263b
ORCID for John Atkinson: ORCID iD

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Date deposited: 27 Mar 2006
Last modified: 17 Jul 2017 16:21

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Author: Yulan Zheng
Author: John Atkinson ORCID iD
Author: Russell Sion

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