Sun, W., McBride, J.W. and Hill, M. (2005) A comparison between the errors in simulated and experimental data in non-contact surface measurement systems. In Proceedings of the 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology - EUSPEN 2005. European Society for Precision Engineering and Nanotechnology. pp. 37-40 .
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Published date: 2005
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5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology - EUSPEN 2005, Montpellier, France, 2005-05-07 - 2005-05-10
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Local EPrints ID: 23212
URI: http://eprints.soton.ac.uk/id/eprint/23212
PURE UUID: 82bf5d72-95e7-4883-9a3e-576768e9b0a1
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Date deposited: 27 Mar 2006
Last modified: 12 Mar 2022 02:33
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Author:
W. Sun
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