Jiang, Liudi, Fitzgerald, A.G. and Rose, M.J. (2002) Microstructural studies of copper incorporated amorphous carbon nitride films. Physica Status Solidi A-Applied Research, 189 (1), 203-207. (doi:10.1002/1521-396X(200201)189:1<203::AID-PSSA203>3.0.CO;2-D).
Abstract
The effects of the incorporation of copper on the microstructure of amorphous carbon nitride films has been studied. Copper incorporated amorphous carbon nitride films (a-C : N : Cu) with different copper concentrations have been prepared by a magnetron co-sputtering technique. Both X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy (FTIR) have been used to characterise the bonding structures in the films. It is found that the N/(N+C) atomic ratio increases due to the incorporation of copper. The results also show that copper incorporation promotes formation of the sp3-bonded carbon nitrogen phase. The diamond nucleation in a-C : N : Cu films, which is determined from the observation of two-phonon diamond absorption FTIR bands, has been ascribed to the favorable formation of the sp3-bonded carbon nitrogen phase in the a-C : N : Cu films.
This record has no associated files available for download.
More information
Identifiers
Catalogue record
Export record
Altmetrics
Contributors
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.